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Yinqiang Zheng - IEEE Xplore Author Profile

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Author details

Yinqiang Zheng

Also published under: YinQiang Zheng

Publications

77

Citations

2,044

Publications by Year

20112025

Co-Authors:

Yuang AiSadakazu AisoTakahito AotoYuta AsanoLong Bao

Show All Co-Authors (161)

Yinqiang Zheng

Also published under: YinQiang Zheng

Affiliation

School of Information Science and Technology

The University of Tokyo

Tokyo, Japan

Publication Topics

Optical Flow,
Peak Signal-to-noise Ratio,
Consecutive Frames,
Depth Estimation,
Generative Adversarial Networks,
Illumination,
Rolling Shutter,
Convolutional Layers,
Deblurring,
Deep Neural Network,
High-speed Camera,
Intermediate Flow

Biography

Yinqiang Zheng (Senior Member, IEEE) received the bachelor’s degree from the Department of Automation, Tianjin University, Tianjin, China, in 2006, the Master of Engineering degree from Shanghai Jiao Tong University, Shanghai, China, in 2009, and the Doctoral of Engineering degree from the Department of Mechanical and Control Engineering, Tokyo Institute of Technology, Tokyo, Japan, in 2013. He is currently an associate professor with the University of Tokyo, Tokyo. He was program committee member for major international conferences, like CVPR, ICCV, ECCV, ICLR, NeurIPS, AAAI, IJCAI, MICCAI, area chair for MVA2017, DICTA2018, ISAIR2019, ACCV2020, 3DV2020, ICCV2021, workshop co-organizer for ICPR2018 and ICCV2019, guest editor for Pattern Re...

Publications

77

Citations

2,044

Publications by Year

20112025

Co-Authors:

Yuang Ai
Sadakazu Aiso
Takahito Aoto
Yuta Asano
Long Bao

Show All Co-Authors (161)

Author's Published Works

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Showing 1-25 of 48 results

Journals (30)

Conferences (18)

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Single Year
Wenxiao Fang(40)
Weiheng Shao(25)
Lei Wang(19)
Yunfei En(17)
Yun Huang(14)
Science and Technology on Reliability Physics and Application of Electronic Component Laboratory, China Electronic Product Reliability and Environmental Testing Research Institute, Guangzhou, China(15)
School of Physics and Optoelectronic Engineering, Guangdong University of Technology, Guangzhou, China(9)
Science and Technology on Reliability Physics and Application of Electronic Component Laboratory, Guangzhou, China(7)
Department of Integrated Circuit, Sun Yat-sen University, Shenzhen, China(4)
Department of Electronic Engineering, Universitat Politecnica de Catalunya, Barcelona, Spain(3)
IEEE Sensors Journal(8)
IEEE Transactions on Electromagnetic Compatibility(6)
IEEE Transactions on Microwave Theory and Techniques(5)
2019 12th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo)(3)
2014 10th International Conference on Reliability, Maintainability and Safety (ICRMS)(2)
IEEE(48)
Media(1)
Hangzhou, China(6)
Guangzhou, China(3)
Nanjing, China(2)
Nusa Dua - Bali, Indonesia(2)
Changchun, China(1)
Electromagnetic Interference(23)
Magnetic Field(23)
Printed Circuit Board(19)
Vector Network Analyzer(19)
Electromagnetic Field(18)

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Results

Non-Contact Time-Varying Current Reconstruction for Electromagnetic Immunity Diagnosis in Electric Vehicle Module Injection Port Testing

Chengyang Luo;Rui Ding;Wenxiao Fang;Weiheng Shao;Jianke Li;Lei Wang;Yiqiang Chen;Raúl Fernández-García

IEEE Transactions on Industrial Electronics

Year: 2025 | Volume: 72, Issue: 1 | Journal Article |

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Traditional noncontact probes fail to meet the time-domain reconstruction requirements for relevant low-frequency signals especially on printed circuit boards (PCBs). In this article, a compact multiloop probe with an accurate simulation model is proposed as an optimized diagnostic tool for electromagnetic immunity tests on electric vehicle modules. The probe with the simulated response coefficien...Show More

Non-Contact Time-Varying Current Reconstruction for Electromagnetic Immunity Diagnosis in Electric Vehicle Module Injection Port Testing

Chengyang Luo;Rui Ding;Wenxiao Fang;Weiheng Shao;Jianke Li;Lei Wang;Yiqiang Chen;Raúl Fernández-García

IEEE Transactions on Industrial Electronics

Year: 2025 | Volume: 72, Issue: 1 | Journal Article |

Four-Port Probe for Simultaneous Measurement of Electric and Magnetic Fields in Near-Field Scanning

Lei Wang;Quan Huang;Tao Zhang;Wenxiao Fang;Zhangming Zhu

IEEE Sensors Journal

Year: 2024 | Volume: 24, Issue: 22 | Journal Article |

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In this article, a symmetric probe with four ports is proposed for ultrawideband and simultaneous near-field measurement of

${H} _{x}$ and

${H} _{y}$ (along the horizontal direction of the probe) and

${E} _{z}$ (along the normal direction of the probe) components from 0.01 to 15 GHz. The probe incorporates four meticulously designed symmetrical loops, created from vias and traces within a fo...Show More

Four-Port Probe for Simultaneous Measurement of Electric and Magnetic Fields in Near-Field Scanning

Lei Wang;Quan Huang;Tao Zhang;Wenxiao Fang;Zhangming Zhu

IEEE Sensors Journal

Year: 2024 | Volume: 24, Issue: 22 | Journal Article |

A Novel Noncontact Differential Method for Current and Voltage Measurements on a Printed Trace Simultaneously

Chengyang Luo;Yichi Zhang;Weiheng Shao;Lei Wang;Wenxiao Fang;Yiqiang Chen;Raúl Fernández-García

IEEE Transactions on Microwave Theory and Techniques

Year: 2024 | Volume: 72, Issue: 10 | Journal Article |

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Noncontact measurement of current and voltage poses various challenges in different applications. In this article, a novel differential reconstruction method for noncontact and simultaneous measurements of current and voltage as well as power on a printed trace is proposed. The principles and calculation procedures of the method are explained in detail. Compared with the previous segregated recons...Show More

A Novel Noncontact Differential Method for Current and Voltage Measurements on a Printed Trace Simultaneously

Chengyang Luo;Yichi Zhang;Weiheng Shao;Lei Wang;Wenxiao Fang;Yiqiang Chen;Raúl Fernández-García

IEEE Transactions on Microwave Theory and Techniques

Year: 2024 | Volume: 72, Issue: 10 | Journal Article |

Noninvasive Flexible Current Probe as a Diagnosis Tool Inside a PWM Chopper Module

Chengyang Luo;Rui Ding;Wenxiao Fang;Lei Wang;Yiqiang Chen;Raúl Fernández-García

IEEE Transactions on Instrumentation and Measurement

Year: 2024 | Volume: 73 | Journal Article |

Cited by: Papers (1)

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Traditional noncontact rigid probes fail to meet the time-domain reconstruction requirements inside industrial modules in an enclosed chamber. In this article, a flexible current probe is proposed as a diagnosis tool to extend the noninvasive time-varying current reconstruction technology inside an industrial PWM-chopper module in an enclosed chamber. The flexibility of the probe allows for direct...Show More

Noninvasive Flexible Current Probe as a Diagnosis Tool Inside a PWM Chopper Module

Chengyang Luo;Rui Ding;Wenxiao Fang;Lei Wang;Yiqiang Chen;Raúl Fernández-García

IEEE Transactions on Instrumentation and Measurement

Year: 2024 | Volume: 73 | Journal Article |

All-Fiber Electric Field Sensor With Tapered Two-Mode Fiber Structure on DR1/PMMA Polymer

Zhibin Li;Pengpeng Fan;Tianyi Zhou;Longwei Han;Jieyuan Tang;Wenguo Zhu;Wentao Qiu;Huadan Zheng;Yongchun Zhong;Wenxiao Fang;Guoguang Lu;Xiong Deng;Xihua Zou;Jianhui Yu;Zhe Chen

IEEE Sensors Journal

Year: 2023 | Volume: 23, Issue: 20 | Journal Article |

Cited by: Papers (1)

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A novel all-fiber electric field (

${E}$ -field) sensor based on a tapered two-mode fiber (TTMF) structure integrated with disperse red 1/polymethyl methacrylate (DR1/PMMA) polymer film is demonstrated for the first time. Here, a TTMF sandwiched between two single-mode fibers (SMFs) works as the modal interferometer with HE11 and HE12 modes, allowing a high-refractive index (RI) sensitivity of 815...Show More

All-Fiber Electric Field Sensor With Tapered Two-Mode Fiber Structure on DR1/PMMA Polymer

Zhibin Li;Pengpeng Fan;Tianyi Zhou;Longwei Han;Jieyuan Tang;Wenguo Zhu;Wentao Qiu;Huadan Zheng;Yongchun Zhong;Wenxiao Fang;Guoguang Lu;Xiong Deng;Xihua Zou;Jianhui Yu;Zhe Chen

IEEE Sensors Journal

Year: 2023 | Volume: 23, Issue: 20 | Journal Article |

An Asymmetric Correction Method for the Differential Double-Loop Magnetic Field Probing System

Weiheng Shao;Yinghui Chen;Lijuan Huang;Wenxiao Fang

IEEE Transactions on Antennas and Propagation

Year: 2023 | Volume: 71, Issue: 10 | Journal Article |

Cited by: Papers (6)

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Symmetry is a critical assumption and an application barrier in a two-port near-field probing system before the asymmetric calibration was proposed. Asymmetric calibration can break through this barrier and benefit probe design and application expansion. In this communication, a novel asymmetric correction method has been proposed to compensate for the influence of the asymmetry element, which is ...Show More

An Asymmetric Correction Method for the Differential Double-Loop Magnetic Field Probing System

Weiheng Shao;Yinghui Chen;Lijuan Huang;Wenxiao Fang

IEEE Transactions on Antennas and Propagation

Year: 2023 | Volume: 71, Issue: 10 | Journal Article |

Electrical Fast Transients Monitoring Based on a Noncontact Voltage Measurement Technology

Rui Ding;Chengyang Luo;Wenxiao Fang

2023 IEEE 3rd International Conference on Electronic Technology, Communication and Information (ICETCI)

Year: 2023 | Conference Paper |

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In this paper, a noncontact monitoring method based on a noncontact voltage probe in electrical fast transients (EFT) test is developed. This method uses Fourier transform and inverse Fourier transform to reconstruct the injected interference pulse waveform. By comparing the measurement results and reconstructed waveform, the validity of the measurement method is confirmed. The method is applied f...Show More

Electrical Fast Transients Monitoring Based on a Noncontact Voltage Measurement Technology

Rui Ding;Chengyang Luo;Wenxiao Fang

2023 IEEE 3rd International Conference on Electronic Technology, Communication and Information (ICETCI)

Year: 2023 | Conference Paper |

A Multicomponent Iterative Method for Efficient Source Reconstruction Based on Magnitude-Only and Single-Plane Near-Field Scanning

Zhiqiang Yi;Jian Zou;Xinxin Tian;Quan Huang;Wenxiao Fang;Weiheng Shao;Yunfei En;Yang Gao;Peng Han

IEEE Transactions on Electromagnetic Compatibility

Year: 2023 | Volume: 65, Issue: 3 | Journal Article |

Cited by: Papers (6)

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A multicomponent iterative method is proposed for efficient source reconstruction based on magnitude-only and single-plane near field scanning. Compared with the conventional method filling the multicomponent data into a whole transformation matrix, the multicomponent iterative method can save huge calculation time by evenly reducing the size of the transformation matrix into magnetic group and el...Show More

A Multicomponent Iterative Method for Efficient Source Reconstruction Based on Magnitude-Only and Single-Plane Near-Field Scanning

Zhiqiang Yi;Jian Zou;Xinxin Tian;Quan Huang;Wenxiao Fang;Weiheng Shao;Yunfei En;Yang Gao;Peng Han

IEEE Transactions on Electromagnetic Compatibility

Year: 2023 | Volume: 65, Issue: 3 | Journal Article |

Nonlocal Noise Removal Technique to Improve the Electromagnetic Field Pattern in Near-Field Scanning of a Device

Quan Huang;Yuxin Wu;Jiangao Ruan;Yan Gao;Wenxiao Fang;Chen Sun;Yunfei En;Peng Han

IEEE Sensors Journal

Year: 2023 | Volume: 23, Issue: 6 | Journal Article |

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A nonlocal noise removal technique, known as block-matching 3-D (BM3D), is introduced to improve the quality of a blurry electromagnetic pattern generated from near field of a device. Noise distribution in electromagnetic pattern is analyzed. Taking the nonlocal self-similarity into account, the BM3D technique removes the noise of the pattern in a 3-D transformation domain based on sparse represen...Show More

Nonlocal Noise Removal Technique to Improve the Electromagnetic Field Pattern in Near-Field Scanning of a Device

Quan Huang;Yuxin Wu;Jiangao Ruan;Yan Gao;Wenxiao Fang;Chen Sun;Yunfei En;Peng Han

IEEE Sensors Journal

Year: 2023 | Volume: 23, Issue: 6 | Journal Article |

An Ultrawideband Asymmetric Calibration Method for a Simultaneously Electromagnetic Near-Field Probing System

Weiheng Shao;Hui Li;Xinxin Tian;Bo Hou;Shan Xue;Duo-Long Wu;Wenxiao Fang;Yiqiang Chen;Changjian Zhou

IEEE Transactions on Microwave Theory and Techniques

Year: 2023 | Volume: 71, Issue: 3 | Journal Article |

Cited by: Papers (15)

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Calibration for asymmetry of the simultaneously electromagnetic near-field probing system is a good way of improving the performance of a two-port probe. The previous rotating asymmetric calibration method (RACM) based on microstrip line measurements at two directions of 0° and 90° is limited to 12 GHz. In this article, a nonrotating asymmetric calibration method (NRACM) is proposed for ultrawideb...Show More

An Ultrawideband Asymmetric Calibration Method for a Simultaneously Electromagnetic Near-Field Probing System

Weiheng Shao;Hui Li;Xinxin Tian;Bo Hou;Shan Xue;Duo-Long Wu;Wenxiao Fang;Yiqiang Chen;Changjian Zhou

IEEE Transactions on Microwave Theory and Techniques

Year: 2023 | Volume: 71, Issue: 3 | Journal Article |

Research on DPI Immunity of Communication Circuit Board

Liuxing He;Wenxiao Fang

2022 IEEE MTT-S International Microwave Workshop Series on Advanced Materials and Processes for RF and THz Applications (IMWS-AMP)

Year: 2022 | Conference Paper |

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In this paper, the direct power injection (DPI) method is used to explore the electromagnetic interference susceptibility of a classic communication circuit board. According to the experimental procedure, a movable experimental platform is built, mainly for the injection of radio frequency interference signal to the power supply (VDD) pin and local area network (LAN) port pin of the device under t...Show More

Research on DPI Immunity of Communication Circuit Board

Liuxing He;Wenxiao Fang

2022 IEEE MTT-S International Microwave Workshop Series on Advanced Materials and Processes for RF and THz Applications (IMWS-AMP)

Year: 2022 | Conference Paper |

Design and Characterization of a Multi-Processed Differential Magnetic Field Probe by Using Asymmetric Calibration Method

Weiheng Shao;Jianfeng Fan;Xinxin Tian;Sha Tang;Zhiqiang Yi;Jiesheng Liu;Bin Liu;Yun Huang;Wenxiao Fang;Changjian Zhou;Duo-Long Wu

IEEE Sensors Journal

Year: 2022 | Volume: 22, Issue: 6 | Journal Article |

Cited by: Papers (18)

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In order to improve the spatial resolution of a magnetic near field probe, the design method combining multiple ports with multiple production processes has been proven effective. However, the asymmetry of transmission structure introduced by the junction between two different processes is a key problem that limits the performance of these probes. In this paper, a differential magnetic near field ...Show More

Design and Characterization of a Multi-Processed Differential Magnetic Field Probe by Using Asymmetric Calibration Method

Weiheng Shao;Jianfeng Fan;Xinxin Tian;Sha Tang;Zhiqiang Yi;Jiesheng Liu;Bin Liu;Yun Huang;Wenxiao Fang;Changjian Zhou;Duo-Long Wu

IEEE Sensors Journal

Year: 2022 | Volume: 22, Issue: 6 | Journal Article |

Radiation Emission Source Localization by Magnetic Near-Field Mapping Along the Surface of a Large-Scale IC With BGA Package

Quan Huang;Rongquan Chen;Wenxiao Fang;Xin Liu;Xinxin Tian;Weiheng Shao;Lei Wang;Chen Sun;Zhiqiang Yi;Yunfei En;Guoguang Lu;Zeyi Li;Yan Gao

IEEE Transactions on Electromagnetic Compatibility

Year: 2022 | Volume: 64, Issue: 2 | Journal Article |

Cited by: Papers (7)

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Near-field mapping along the surface of an integrated circuit (IC) could reveal the radiated emission source inside by collecting the radiated electromagnetic field. In this article, the radiated emission source localization is first illustrated in a microstrip line model by analyzing the relationship between the physical position of the line and the hot spots of the electromagnetic field distribu...Show More

Radiation Emission Source Localization by Magnetic Near-Field Mapping Along the Surface of a Large-Scale IC With BGA Package

Quan Huang;Rongquan Chen;Wenxiao Fang;Xin Liu;Xinxin Tian;Weiheng Shao;Lei Wang;Chen Sun;Zhiqiang Yi;Yunfei En;Guoguang Lu;Zeyi Li;Yan Gao

IEEE Transactions on Electromagnetic Compatibility

Year: 2022 | Volume: 64, Issue: 2 | Journal Article |

Orientation Effect of the Electromagnetic Field Coupling for Device in a TEM Cell

Wenxiao Fang;Zeyi Li;Rongquan Chen;Quan Huang;Weiheng Shao;Xinxin Tian;Lei Wang;Yunfei En

IEEE Transactions on Microwave Theory and Techniques

Year: 2022 | Volume: 70, Issue: 2 | Journal Article |

Cited by: Papers (4)

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In this article, the orientation effect of electromagnetic coupling for a device in a transverse electromagnetic (TEM) cell is explained in the frame of the model with intercoupling of equivalent electric and magnetic dipoles taken into account. Different from the widely used model, which predicts a half-circle period of the orientation effect, the proposed model predicts a full-circle period due ...Show More

Orientation Effect of the Electromagnetic Field Coupling for Device in a TEM Cell

Wenxiao Fang;Zeyi Li;Rongquan Chen;Quan Huang;Weiheng Shao;Xinxin Tian;Lei Wang;Yunfei En

IEEE Transactions on Microwave Theory and Techniques

Year: 2022 | Volume: 70, Issue: 2 | Journal Article |

Research of Microprocessor Electrical Fast Transient Pulse Group Testing

Lei Liu;Wenxiao Fang;Xiangjun Lu;Shuwang Dai

2021 6th International Conference on Integrated Circuits and Microsystems (ICICM)

Year: 2021 | Conference Paper |

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Electrical Fast Transient Pulse (EFT) is a kind of transient pulse interference caused by lightning, grounding fault or the switching of inductive load in circuit. Researchers from Cisco, Intel and other companies have proposed a model to simulate the EFT pulse coupling into the IC’s power pin and input/output (I/O) pin through the EFT transient disturbance rejection direction, which is use...Show More

Research of Microprocessor Electrical Fast Transient Pulse Group Testing

Lei Liu;Wenxiao Fang;Xiangjun Lu;Shuwang Dai

2021 6th International Conference on Integrated Circuits and Microsystems (ICICM)

Year: 2021 | Conference Paper |

Electromagnetic Conductive Immunity of a Microcontroller by Direct Power Injection

ShuWang Dai;XiangJun Lu;Yong Zhang;Lei Liu;WenXiao Fang

2021 6th International Conference on Integrated Circuits and Microsystems (ICICM)

Year: 2021 | Conference Paper |

Cited by: Papers (3)

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This paper deals with direct power injection (DPI) test research and its fabrication of test circuit board, construction of test system, and failure analysis. Such a sensitivity test aims to assist designers in assessing the IC’s (integrated circuits) susceptibility to radio frequency interferences (RFI) during the design phase of the IC. The IEC 62132-4 standard method of immunity measurem...Show More

Electromagnetic Conductive Immunity of a Microcontroller by Direct Power Injection

ShuWang Dai;XiangJun Lu;Yong Zhang;Lei Liu;WenXiao Fang

2021 6th International Conference on Integrated Circuits and Microsystems (ICICM)

Year: 2021 | Conference Paper |

A Field Iterative Method for Efficient Source Reconstruction Based on Magnitude-only and Single-plane Near-field Scanning

Jian Zou;Ruohe Yao;Xinxin Tian;Quan Huang;Wenxiao Fang;Weiheng Shao;Yunfei En;Zhiqiang Yi

2021 Asia-Pacific International Symposium on Electromagnetic Compatibility (APEMC)

Year: 2021 | Conference Paper |

Cited by: Papers (2)

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Radio-frequency interference (RFI) problems in modern electronic product become complex which result in the increasing number of scanning points. Conventional near-field phaseless source reconstruction methods such as double planes iteration method and single plane iteration method will spend a lot of time in both scanning and calculating. To save the calculating time and scanning time, an alterna...Show More

A Field Iterative Method for Efficient Source Reconstruction Based on Magnitude-only and Single-plane Near-field Scanning

Jian Zou;Ruohe Yao;Xinxin Tian;Quan Huang;Wenxiao Fang;Weiheng Shao;Yunfei En;Zhiqiang Yi

2021 Asia-Pacific International Symposium on Electromagnetic Compatibility (APEMC)

Year: 2021 | Conference Paper |

Research on Calibration Method of Horizontal Loop Magnetic Near-Field Probe

Pengcheng Huang;Quan Huang;Zhijian Chen;Yuchen Wang;Weiheng Shao;Kaiwei Wang;Wenxiao Fang;Yan Gao;Chen Sun;Guoguang Lu;Yun Huang

2021 Asia-Pacific International Symposium on Electromagnetic Compatibility (APEMC)

Year: 2021 | Conference Paper |

Cited by: Papers (1)

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Internationally, electromagnetic near- field probe is an important tool to solve the EMC problem of integrated circuits. However, the IEC61967 standard only specifies the calibration method of vertical loop magnetic near-field probe (measuring horizontal magnetic field). This paper proposes a calibration method of horizontal-loop magnetic near-field probe based on micro-strip line TEM field based ...Show More

Research on Calibration Method of Horizontal Loop Magnetic Near-Field Probe

Pengcheng Huang;Quan Huang;Zhijian Chen;Yuchen Wang;Weiheng Shao;Kaiwei Wang;Wenxiao Fang;Yan Gao;Chen Sun;Guoguang Lu;Yun Huang

2021 Asia-Pacific International Symposium on Electromagnetic Compatibility (APEMC)

Year: 2021 | Conference Paper |

Novel Calibration Method for the Asymmetric Probing in the Near-Field Measurement With a Dual Probe

Weiheng Shao;Zhiqiang Yi;Xiao He;Wenxiao Fang;Changjian Zhou;Jiesheng Liu

IEEE Transactions on Microwave Theory and Techniques

Year: 2021 | Volume: 69, Issue: 12 | Journal Article |

Cited by: Papers (25)

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Dual probe is capable of simultaneously measuring electric and magnetic fields in the same position, given that perfectly symmetric design is realized on the transmission paths connecting the detection loop and the probe outputs. For general application, a calibration method for the asymmetric probing in near-field measurement with the dual probe is presented, in order to deal with the failure of ...Show More

Novel Calibration Method for the Asymmetric Probing in the Near-Field Measurement With a Dual Probe

Weiheng Shao;Zhiqiang Yi;Xiao He;Wenxiao Fang;Changjian Zhou;Jiesheng Liu

IEEE Transactions on Microwave Theory and Techniques

Year: 2021 | Volume: 69, Issue: 12 | Journal Article |

Systematic Characterization of Dual Probes for Electromagnetic Near-Field Measurement

Weiheng Shao;Xinxin Tian;Rongquan Chen;Xiao He;Wenxiao Fang;Ping Lai;Guoguang Lu;Yuandong Guo;Lei Wang;Yun Huang;Yunfei En;Yunlei Shi

IEEE Sensors Journal

Year: 2021 | Volume: 21, Issue: 4 | Journal Article |

Cited by: Papers (22)

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In this paper, systematic characterization of the dual probe, which is designed for the near field simultaneous measurement of both electric and magnetic field, is investigated with a microstrip line as the device under test (DUT). The characterization includes frequency response, transmission performance, symmetry, reflection, the intrusion of probe to the DUT, isolation of electric and magnetic ...Show More

Systematic Characterization of Dual Probes for Electromagnetic Near-Field Measurement

Weiheng Shao;Xinxin Tian;Rongquan Chen;Xiao He;Wenxiao Fang;Ping Lai;Guoguang Lu;Yuandong Guo;Lei Wang;Yun Huang;Yunfei En;Yunlei Shi

IEEE Sensors Journal

Year: 2021 | Volume: 21, Issue: 4 | Journal Article |

Theoretical Study of Bilayer Composite Barrier Based Ferroelectric Tunnel Junction Memory

Huali Duan;Wenxiao Fang;Leitao Liu;Wenchao Chen

2020 IEEE MTT-S International Conference on Numerical Electromagnetic and Multiphysics Modeling and Optimization (NEMO)

Year: 2020 | Conference Paper |

Cited by: Papers (3)

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In this work, majority carrier tunneling current in Ferroelectric tunnel junction (FTJ) with bilayer composite barrier is simulated theoretically by using finite difference method and Wentzel-Kramers-Brillouin (WKB) method. The simulation results reveal that the metal/Al2O3/HZO/Si FTJ has a significant enhanced tunneling electroresistance (TER) effect as compared to traditional FTJ, and are also c...Show More

Theoretical Study of Bilayer Composite Barrier Based Ferroelectric Tunnel Junction Memory

Huali Duan;Wenxiao Fang;Leitao Liu;Wenchao Chen

2020 IEEE MTT-S International Conference on Numerical Electromagnetic and Multiphysics Modeling and Optimization (NEMO)

Year: 2020 | Conference Paper |

A Multiple Scattering Method for Efficient Analysis of Substrate-Integrated Waveguide Structures

Xinxin Tian;Duo-Long Wu;Wenxiao Fang;Weiheng Shao;Yun Huang;Liangqi Gui;Yao-Jiang Zhang

IEEE Microwave and Wireless Components Letters

Year: 2020 | Volume: 30, Issue: 10 | Journal Article |

Cited by: Papers (2)

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A multiple scattering method is proposed for the analysis of substrate-integrated waveguide (SIW) structures in this letter. SIW structures are considered to be parallel plates embedded by the fence of metallic vias (labeled as SIW vias). The addition theorem of cylindrical waves is applied to the calculation of the multiple scattering among SIW vias and coaxial ports. The reflection matrix of SIW...Show More

A Multiple Scattering Method for Efficient Analysis of Substrate-Integrated Waveguide Structures

Xinxin Tian;Duo-Long Wu;Wenxiao Fang;Weiheng Shao;Yun Huang;Liangqi Gui;Yao-Jiang Zhang

IEEE Microwave and Wireless Components Letters

Year: 2020 | Volume: 30, Issue: 10 | Journal Article |

Ultrawideband Differential Magnetic Near Field Probe With High Electric Field Suppression

Guangwei Li;Weiheng Shao;Rongquan Chen;Xinxin Tian;Quan Huang;Xiu Yin Zhang;Wenxiao Fang;Yiqiang Chen

IEEE Sensors Journal

Year: 2020 | Volume: 20, Issue: 14 | Journal Article |

Cited by: Papers (51)

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In this paper, an ultrawideband differential magnetic near field probe with high electric field suppression is developed. A pair of differential loops, via fence and shielding vias below the loops are designed to reduce the electric field coupling. It is shown that the electric field suppression of the proposed magnetic-field probe is higher than 30 dB up to 12.9 GHz and 21 dB up to 14 GHz. Due to...Show More

Ultrawideband Differential Magnetic Near Field Probe With High Electric Field Suppression

Guangwei Li;Weiheng Shao;Rongquan Chen;Xinxin Tian;Quan Huang;Xiu Yin Zhang;Wenxiao Fang;Yiqiang Chen

IEEE Sensors Journal

Year: 2020 | Volume: 20, Issue: 14 | Journal Article |

Broadband Circularly Polarized Cross-Dipole Antenna With Multiple Modes

Lei Wang;Wen-Xiao Fang;Wei-Heng Shao;Bin Yao;Yun Huang;Yun-Fei En

Year: 2020 | Volume: 8 | Journal Article |

Cited by: Papers (10)

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A broadband circularly polarized (CP) cross-dipole antenna with multiple modes is proposed. The antenna is composed of two pairs of crossed strip dipoles as driven elements, four square-slot patches, and four corner-truncated patches as parasitic elements. A pair of vacant-quarter printed rings is used as sequential phase feeding structure to generate a CP mode, which connect to crossed strip dipo...Show More

Broadband Circularly Polarized Cross-Dipole Antenna With Multiple Modes

Lei Wang;Wen-Xiao Fang;Wei-Heng Shao;Bin Yao;Yun Huang;Yun-Fei En

Year: 2020 | Volume: 8 | Journal Article |

Study of the HPM Interference Effect on Integrated Circuit in a TEM Cell

Xue-Cheng Xu;Chun-Yong Han;E Shao;Xiang-Jun Lu;Wen-Xiao Fang;Rong-Quan Chen;Heng-Zhou Liu;Wei-Heng Shao;Yun-Lei Shi

2019 International Conference on Quality, Reliability, Risk, Maintenance, and Safety Engineering (QR2MSE)

Year: 2019 | Conference Paper |

Cited by: Papers (1)

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In this paper, HPM is used as the source of interference to affect the working state of an integrated circuit. The effect of the injected power and the orientation of the studied integrated circuit (FPGA) is investigated. In the experiment, it is found that the induced voltage of the I/O pin can reach 70.3 V under the electromagnetic field high to 1257.44 V/m. In spite of this, the working state o...Show More

Study of the HPM Interference Effect on Integrated Circuit in a TEM Cell

Xue-Cheng Xu;Chun-Yong Han;E Shao;Xiang-Jun Lu;Wen-Xiao Fang;Rong-Quan Chen;Heng-Zhou Liu;Wei-Heng Shao;Yun-Lei Shi

2019 International Conference on Quality, Reliability, Risk, Maintenance, and Safety Engineering (QR2MSE)

Year: 2019 | Conference Paper |

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