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Channeling effect of low energy boron implant in | IEEE Journals & Magazine | IEEE Xplore

Channeling effect of low energy boron implant in


Abstract:

Unintentional ion channeling in low energy ion implantation of boron into

Abstract:

Unintentional ion channeling in low energy ion implantation of boron into
Published in: IEEE Electron Device Letters ( Volume: 4, Issue: 3, March 1983)
Page(s): 59 - 62
Date of Publication: 09 August 2005

ISSN Information:

Department of Electrical Engineering and Computer Sciences, Electronics Research Laboratory, University of California, Berkeley, CA, USA
Department of Electrical Engineering and Computer Sciences, Electronics Research Laboratory, University of California, Berkeley, CA, USA

Department of Electrical Engineering and Computer Sciences, Electronics Research Laboratory, University of California, Berkeley, CA, USA
Department of Electrical Engineering and Computer Sciences, Electronics Research Laboratory, University of California, Berkeley, CA, USA
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