Single-inductor multiple-output (SIMO) converters present a promising technology for enabling fine-grained supply-voltage domains in SoCs. With efficiencies approaching those of buck converters, SIMO converters allow multiple domains to share a single inductor, thus reducing the use of bulky passive components [1–5]. However, SIMO converters suffer from a poor transient response and significant ripple, requiring extensive margining. Operation at an elevated -and, therefore, the load-current - inflates power draw and further reduces system efficiency , i.e. the ratio of the useful (margin-free) output power to input power draw.
Abstract:
Single-inductor multiple-output (SIMO) converters present a promising technology for enabling fine-grained supply-voltage (Vdd) domains in SoCs. With efficiencies approac...Show MoreMetadata
Abstract:
Single-inductor multiple-output (SIMO) converters present a promising technology for enabling fine-grained supply-voltage (Vdd) domains in SoCs. With efficiencies approaching those of buck converters, SIMO converters allow multiple domains to share a single inductor, thus reducing the use of bulky passive components [1-5]. However, SIMO converters suffer from a poor transient response and significant ripple, requiring extensive Vdd margining. Operation at an elevated Vdd-and, therefore, the load-current (Iload )-inflates power draw and further reduces system efficiency (ηsystem), i.e. the ratio of the useful (margin-free) output power to input power draw.
Date of Conference: 13-22 February 2021
Date Added to IEEE Xplore: 03 March 2021
ISBN Information:
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Keywords assist with retrieval of results and provide a means to discovering other relevant content. Learn more.
- IEEE Keywords
- Index Terms
- 65-nm CMOS ,
- Adaptive Clocking ,
- Optimal Control ,
- Transient Response ,
- Total Charge ,
- Proportional-integral-derivative ,
- Marginal Reduction ,
- Voltage Sag ,
- Voltage Error ,
- Buck Converter ,
- Total Delivery ,
- Load Disturbance ,
- Load Transients ,
- Powerful Architecture ,
- Test Chip ,
- Time-to-digital Converter ,
- Cycle Loss ,
- Cycle Count
Keywords assist with retrieval of results and provide a means to discovering other relevant content. Learn more.
- IEEE Keywords
- Index Terms
- 65-nm CMOS ,
- Adaptive Clocking ,
- Optimal Control ,
- Transient Response ,
- Total Charge ,
- Proportional-integral-derivative ,
- Marginal Reduction ,
- Voltage Sag ,
- Voltage Error ,
- Buck Converter ,
- Total Delivery ,
- Load Disturbance ,
- Load Transients ,
- Powerful Architecture ,
- Test Chip ,
- Time-to-digital Converter ,
- Cycle Loss ,
- Cycle Count