The proceedings of this conference will be available for purchase through Curran Associates.
Dielectrics (ICD), 2018 IEEE 2nd International Conference on
Sebastian Wels;Jens Obst;Albert Claudi;Bianca Böttge;Rico Bernhardt;Sandy Klengel
Zhiyu Cao;Yewen Zhang;Cong Guo;Feihu Zheng;Zhenlian An;Zhien Zhu;Liming Yang;Stéphane Holé;Enke Yu;Xinlong zheng
Younes Norouzi;Christian Frohne;Volker Gauler;Peter Werle;Sahand Seifi
J. M. Martínez-Tarifa;G. Robles;J. M. Fresno;J. A. Ardila-Rey
Ricardo Frascella;Juan Velasco;Ricardo Albarracín;Víctor Antonio Primo
Cheng Chen;Mingkang Niu;Lei Wang;Yang Ge;Meng Huang;Yuzhen Lv;Chengrong Li
Yongning Wang;Guangzhen Liu;Xiaoguang Ma;Chi Zhang;Jin He;Xuan Xu;Bingliang Shan;Meng Huang
Yoshimichi Ohki;Ryosuke Yanashima;Chisato Azeyanagi;Naoshi Hirai
Zhonglei Li;Zhuoran Yang;Boxue Du;Mi Xiao;Jingang Su;Wenbo Zhu;Lewei Zhu;Xiaoxiao Kong
The proceedings of this conference will be available for purchase through Curran Associates.
Dielectrics (ICD), 2018 IEEE 2nd International Conference on
A not-for-profit organization, IEEE is the world's largest technical professional organization dedicated to advancing technology for the benefit of humanity.
© Copyright 2025 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.