Lorena Anghel (M'02) received the B.Sc. and M.Sc. in electrical engineering and telecommunications from the Polytechnic Institute of Bucharest, Bucharest, Romania, in 1996 and 1997, respectively, and the Ph.D. degree from the National Polytechnic Institute of Grenoble (INPG), Grenoble, France.
She is currently an Associate Professor at the same institution and a member of the research staff at the Techniques of Informatics and Microelectronics for Computer Architectures (TIMA) Laboratory, Grenoble, France. Her research interests include VLSI testing, fault tolerance, soft errors, reliable design, timing optimization, power analysis and optimization.
Dr. Anghel has been an Organizing Committee member of IEEE VLSI Test Symposium, IEEE On-Line Test Symposium, and Program Committee member of several fault design and tolerance and testing conferences such as IEEE Latin American Test Workshop, IEEE Design and Fault Tolerance. She was General Chair of IEEE On-Line Test Symposium in 2005, and Program Chair of School on the Effects of Radiation on Embedded Systems for Space Applications (SERESSA) in 2006 and 2007. She has been involved in European Projects and several Media projects, as well as being coordinator of national projects. Dr. Anghel has been the recipient of several Best Paper Awards, including at the Design Automation and Test in Europe (DATE), and the IEEE VLSI Test Symposium (VTS) conferences.
Lorena Anghel (M'02) received the B.Sc. and M.Sc. in electrical engineering and telecommunications from the Polytechnic Institute of Bucharest, Bucharest, Romania, in 1996 and 1997, respectively, and the Ph.D. degree from the National Polytechnic Institute of Grenoble (INPG), Grenoble, France.
She is currently an Associate Professor at the same institution and a member of the research staff at the Techniques of Informatics and Microelectronics for Computer Architectures (TIMA) Laboratory, Grenoble, France. Her research interests include VLSI testing, fault tolerance, soft errors, reliable design, timing optimization, power analysis and optimization.
Dr. Anghel has been an Organizing Committee member of IEEE VLSI Test Symposium, IEEE On-Line Test Symposium, and Program Committee member of several fault design and tolerance and testing conferences such as IEEE Latin American Test Workshop, IEEE Design and Fault Tolerance. She was General Chair of IEEE On-Line Test Symposium in 2005, and Program Chair of School on the Effects of Radiation on Embedded Systems for Space Applications (SERESSA) in 2006 and 2007. She has been involved in European Projects and several Media projects, as well as being coordinator of national projects. Dr. Anghel has been the recipient of several Best Paper Awards, including at the Design Automation and Test in Europe (DATE), and the IEEE VLSI Test Symposium (VTS) conferences.View more