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Application-independent testing of FPGA interconnects | IEEE Journals & Magazine | IEEE Xplore

Application-independent testing of FPGA interconnects


Abstract:

We present a new automatic test-configuration-generation technique for application-independent manufacturing testing of the interconnection network of static-random-acces...Show More

Abstract:

We present a new automatic test-configuration-generation technique for application-independent manufacturing testing of the interconnection network of static-random-access-memory-based field programmable gate arrays (FPGAs). This technique targets detection of open and bridging faults in the wiring channels and programmable switches in the interconnects. Experimental results on Xilinx Virtex FPGAs show that very few test configurations are required to cover stuck-open, stuck-closed, open, and bridging faults in the interconnects.
Page(s): 1774 - 1783
Date of Publication: 24 October 2005

ISSN Information:


I. Introduction

Field Programmable Gate Arrays (FPGAs) are programmable platforms for lots of applications such as networking, signal processing, encryption, and storage systems. In static random access memory (SRAM)-based FPGAs, logic elements and programmable switches can be reprogrammed by loading a configuration bitstream, giving FPGAs an incredible flexibility to implement any digital circuit on the same piece of silicon.

References

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