I. Introduction
Magnetic near-field measurement for analyzing integrated circuit electromagnetic interference [1], [2], [3] becomes increasingly important with the technological development of miniaturization and high frequency. The magnetic field probe and its measurement system are used as an essential diagnostic tool that attracts more attention, such as high-performance probe design [4], [5], [6], characterization [7], [8], [9], and application [10], [11], [12].