I. Introduction
Near-field scanning technology has a long history in antenna measurement [1]. In comparison with the far-field measurement, it is more cost-effective and is preferred in radiation pattern prediction and antenna array diagnosis [2]. Recently, there is a great demand of the near-field scanning for the electromagnetic interference (EMI) diagnosis [3]. For the compact and high-speed electronic systems, passive components and traces on printed circuit boards (PCBs) become unwanted antennas [4]. Their near-field coupling and far-field radiation tend to be more serious. Planar near-field scanning technology becomes an effective method to locate radiation sources and predict the far-field radiation [5].