ARFTG Conference
2016 87th ARFTG Microwave Measurement Conference (ARFTG)
27-27 May 2016
Showing 1-25 of 34
Proceedings
The proceedings of this conference will be available for purchase through Curran Associates.
Microwave Measurement Conference (ARFTG), 2016 87th ARFTG
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Emulation of array coupling influence on RF power amplifiers in a measurement setup
Publication Year: 2016,Page(s):1 - 4
A new method for emulating array coupling influence on RF power amplifiers in a measurements setup is presented. This method is based on an iterative procedure, where a signal is injected towards the output of the power amplifier, based on the output signal of the power amplifier measured in the previous iteration. Thus any coupling can be emulated by injecting an appropriately scaled signal. Emul...Show More
Comparison of timebase interpolation methods for traceable, wideband mm-wave communication signals
Robert D. Horansky;Diogo C. Ribeiro;Kate A. Remley;Paul D. Hale;Chih-Ming Wang;Dylan F. Williams;Nuno B. Carvalho
Publication Year: 2016,Page(s):1 - 4
Cited by: Papers (4)
An integral part of processing a signal from a calibrated, equivalent-time sampling oscilloscope is accurately determining sampling times and then interpolating the resulting irregularly-spaced time grid to create a uniform time spacing. In this paper, we present simulations and measurements to determine the effect of the interpolation choice on the fidelity of a modulated signal. We judge the eff...Show More
The paper deals with S-parameters characterization process of newly developed and fabricated high impedance calibration standards, based on APC-7 microwave connectors, suitable for extreme impedances measurement. It evaluates all critical factors playing significant role in the process including dimension and material characterization and used fabrication technology. A combination of the electroma...Show More
Traceable calibration with 1.0mm coaxial standards
Publication Year: 2016,Page(s):1 - 4
Cited by: Papers (2)
We present an SI traceable calibration of a vector network analyzer with 1.0mm connectors. The modeling of the offset short standards and the used calibration algorithm yield results which are physically plausible and have up to 5 times lower uncertainties than existing calibrations for 1.0mm connectors.Show More
Developing models for Type-N coaxial VNA calibration kits within the NIST Microwave Uncertainty Framework
Publication Year: 2016,Page(s):1 - 4
Cited by: Papers (10)
We developed models for Type-N coaxial vector network analyzer (VNA) calibration kits within the NIST Microwave Uncertainty Framework. First, we created physical models of commercially-available standards that support multiline thru-reflect-line (TRL) and open-short-load-thru (OSLT) calibrations, and included error mechanisms in each of the standards' constituent parameters that were utilized in t...Show More
Multimode analysis of a one-port, i.e., single, dual ridged waveguide probe is presented. This work significantly extends previous dual ridged waveguide probe research in which only the dominant mode was considered. The theoretical analysis of the dual ridged waveguide probe with higher-order modes is presented and discussed. Experimental results of a magnetic shielding material are presented to i...Show More
AMC pin waveguide flange for screw redundant millimeter and submillimeter measurements
Sofia Rahiminejad;Elena Pucci;Vessen Vassilev;Sjoerd Haasl;Per-Simon Kildal;Peter Enoksson
Publication Year: 2016,Page(s):1 - 4
Cited by: Papers (1)
Measurements with waveguide flanges at frequencies above 100GHz have a considerable issue with leakage due to problems with achieving good electrical contact between the opposite flanges. The higher the frequency, the higher is the requirement for full contact. However, by using an artificial magnetic conducting (AMC) flange on one side of the interface, full electric contact is not needed between...Show More
Mixed-signal characterization approaches for emerging wireless technologies
Diogo C. Ribeiro;André Prata;Pedro M. Cruz;Nuno Borges Carvalho
Publication Year: 2016,Page(s):1 - 4
Radio technology advances at good pace into higher frequencies and higher integration. This is especially notorious for new mixed-signal devices which concentrate entire radio-frequency (RF) chains with high frequency data-converters sub-systems. D-parameters are an alternative framework for behavioural modelling of complete radio-oriented mixed-signal devices. This framework is based on the well-...Show More
Importance and measurement of phase-stiffness in RF switching amplifiers
Dubravko Babić;Earl McCune;Waclaw Godycki;Quentin Diduck;Douglas Kirkpatrick
Publication Year: 2016,Page(s):1 - 4
Cited by: Papers (2)
Phase-stiffness is a measure of the ability of an RF power amplifier to tolerate disturbance injected into its output. Phase-stiffness of conventional (linear) RF power amplifiers used in phased-array radar results from inserting circulators and isolators on their output as they can not tolerate typical disturbances arising from antenna mismatch and signals arriving from mutual coupling of array e...Show More
Computationally efficient coefficient estimator used in memory-based digital predistortion (DPD) models
Publication Year: 2016,Page(s):1 - 4
Cited by: Papers (3)
Computationally efficient estimation of digital predistortion (DPD) coefficients for memory polynomial, gain polynomial, and pruned Volterra series models is proposed. In all three cases, the basis waveforms within the estimator are specified in the frequency domain as a function of memoryless waveforms and delay operators, thereby reducing the number of FFTs needed and allowing the tap spacing to...Show More
Novel design features for the improvement of linearity in filter structures for PIM measurements
Publication Year: 2016,Page(s):1 - 4
In recent years, passive intermodulation (PIM) has become increasingly critical in modern mobile communication systems due to a more dense allocation of the available spectrum. Thus, the requirements on components for such systems have increased as well. As a consequence, problems arose for PIM measurements as the residual PIM of the measurement devices has not improved significantly over the same...Show More
Investigating correlations in frequency-domain S-parameter measurements
Publication Year: 2016,Page(s):1 - 4
Cited by: Papers (1)
This paper presents a simple and straightforward method to explore correlations between S-parameter data in the frequency domain. In contrast to existing methods like e.g. uncertainty ellipses, which can only provide information at one given freqency, the new method can visualize correlations between measurement data at different frequency points over the entire measurement bandwidth. The procedur...Show More
Verification of a foundry-developed transistor model including measurement uncertainty
Dylan Williams;Wei Zhao;Richard A. Chamberlin;Jerome Cheron;Miguel Urteaga
Publication Year: 2016,Page(s):1 - 4
Cited by: Papers (4)
We verify a foundry model for state-of-the-art 250 nm heterojunction bipolar transistors with large-signal measurements. We demonstrate the propagation of correlated measurement uncertainties through the verification process, and use them to quantify the differences we observe in the measurements and models.Show More
Impact of microwave measurement uncertainty on the Nonlinear Embedding procedure
Gianni Bosi;Antonio Raffo;Gustavo Avolio;Dominique Schreurs;David A. Humphreys
Publication Year: 2016,Page(s):1 - 4
Cited by: Papers (1)
Simultaneous measurement of optical and RF behavior under CW and pulsed Fully Active Harmonic Load-Pull
Publication Year: 2016,Page(s):1 - 4
Cited by: Papers (1)
Here we present a system capable of simultaneous measurements of the RF and optical behavior of on-wafer devices, permitting the complete range of Fully Active Harmonic Load-Pull techniques to be employed while either observing optical phenomena such as Electroluminescence, or applying optical stimuli for trapping investigations. Full access to the backside of the wafer is achieved, allowing measu...Show More
W-band passive load pull system for on-wafer characterization of high power density N-polar GaN devices based on output match and drive power requirements vs. gate width
Matthew Guidry;Steven Wienecke;Brian Romanczyk;Xun Zheng;Haoran Li;Elaheh Ahmadi;Karine Hestroffer;Stacia Keller;Umesh K. Mishra
Publication Year: 2016,Page(s):1 - 4
Cited by: Papers (18)
A W-band on-wafer passive load pull system constructed for the characterization of high power density N-polar GaN devices is presented. N-Polar GaN's large RF voltage swing enables high power densities but also increases the power match impedance which must be synthesized with the limited on-wafer tuning range. Increasing test cell gate width to decrease impedance increases the system's drive powe...Show More
Wideband RF characterization setup with high dynamic range low frequency measurement capabilities
Sebastian Gustafsson;Christian Fager;Koen Buisman;Mattias Thorsell
Publication Year: 2016,Page(s):1 - 4
Cited by: Papers (5)
In this paper, a wideband RF characterization setup with low-frequency (LF) measurement capabilities is presented. Simultaneous LF and RF measurements enable studies of trapping phenomena, thermal effects and other LF-related nonlinear distortion in microwave devices using realistic wideband RF stimuli. The setup is capable of measuring up to 4 GHz through the RF path, and from DC to 125 MHz throu...Show More
Measurement of terahertz detector responsivity using an optical time domain spectrometer
Publication Year: 2016,Page(s):1 - 3
This paper presents a technique to measure terahertz detector responsivity using an optical terahertz time domain spectrometer. The detectors are based on ballistic MOSFET behaviour at terahertz frequency and were designed and fabricated using a 180 nanometer CMOS process with a detector-antenna co-design methodology assisted by high-frequency IC design tools and EM simulators. The tests were perf...Show More
Supply-terminal 40 MHz BW characterization of impedance-like nonlinear functions for envelope tracking PAs
Gian Piero Gibiino;Julien Couvidat;Gustavo Avolio;Dominique Schreurs;Alberto Santarelli
Publication Year: 2016,Page(s):1 - 4
Cited by: Papers (12)
We present an approach for the dynamic characterization of the non-idealities arising in envelope tracking (ET) systems when either the radio-frequency (RF) power amplifier (PA) or the supply modulator (SM) are driven into nonlinear operation. Impedance-like nonlinear functions, derived through a modified Volterra formulation, are here introduced and measured at the supply terminal over 40 MHz ban...Show More
Calibration of a real-time load-pull system using the generalized theory of the TRM technique
M.A Pulido-Gaytán;J.A. Reynoso-Hernández;M.C. Maya-Sánchez;J.R. Loo-Yau
Publication Year: 2016,Page(s):1 - 4
Cited by: Papers (1)
The thru-reflect-match (TRM) calibration technique uses as calibration structures a thru, a pair of highly reflecting loads and two loads of impedance close to the measuring system impedance (Z0). In practice, the loads used as match standard may be nonsymmetrical and of impedance different from Z0. By using the ABCD-parameters matrix formalism, in this paper the calibration of a load-pull system ...Show More
Microwave dielectric characterization of flexible plastic films using printed electronics
Publication Year: 2016,Page(s):1 - 4
Cited by: Papers (20)
This work describes the development of a wideband RF measurement technique using printed test structures for characterizing the complex dielectric properties of flexible substrates at RF and microwave frequencies. This novel method is based on a single probe measurement using two concentric circular capacitors with different gap sizes that can be additively manufactured on the dielectric film unde...Show More
Characterisation of integrated GaN power switches using pulsed-IV and time domain measurements
Publication Year: 2016,Page(s):1 - 4
This paper reports the investigation of RF GaN HEMTs as integrated power switches in high frequency, high efficiency switching topologies. GaN HEMTs suffer from trap phenomena which degrades the performance of the HEMT when used as power switches. Pulsed IV characterisation revealed upto 50% reduction in the theoretically available output power, at pulse frequency of 500 KHz and quiescent switch v...Show More
Proceedings
The proceedings of this conference will be available for purchase through Curran Associates.
Microwave Measurement Conference (ARFTG), 2016 87th ARFTG
- Print on DemandPurchase at Partner
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