I. Introduction
Scanning electron microscope (SEM) image analysis facilitates the quantification of the microstructural topology, morphology, and connectivity of distinct components in a material. Image analysis has been well adopted in industries requiring material characterization. Image segmentation is a crucial step in image analysis. Segmentation is the division of an image into spatially continuous, disjoint, and homogeneous regions [1]. Manual segmentation performed by the subject matter expert is the most reliable segmentation approach; however, it requires considerable time, attention, and patience. We propose an automated image-segmentation method that couples classical feature extraction with supervised classification algorithms.