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Yaokun Wu - IEEE Xplore Author Profile

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Scanning electron microscope (SEM) image can capture the distribution, topology, and morphology of microstructural constituents of geological materials. Segmentation of SEM image is needed to delineate/locate the various microstructural constituents. To locate locating kerogen/organic matter and pores in shale samples, we test an automated SEM-image segmentation workflow involving feature extracti...Show More