I. Introduction
High temperature in embedded systems with modern systems-on-chips (SoCs) causes several major issues. An increase in temperature has a considerable impact in the growth of leakage current which leads to rise in static power consumption. An increase in power consumption levels up the device temperature, thereby resulting in again an increase in power consumption. This detrimental loop causes not only rapid battery drain but also "thermal runaway" [3]. Furthermore, studies show that operating in high temperature reduces the system reliability substantially [42]. For instance, 10°C to 15°C increase in temperature doubles the probability of failure of the underlying electronic devices [44]. Thermal violation not only reduces the reliability in real-time implantable medical devices, but also causes physical harm [6]. Therefore, bounding the maximum temperature is an important issue, especially when real-time requirements have to be satisfied.