Michael G. Pecht (S’78–M’83–SM’90–F’92) received the B.S. degree in physics, the M.S. degree in electrical engineering and the M.S. and Ph.D. degrees in engineering mechanics from the University of Wisconsin, Madison, WI, USA, in 1976, 1978, 1979, and 1982, respectively.
He has authored or coauthored more than 20 books on product reliability, development, use and supply chain management. He has also authored or coauthored a series of books of the electronics industry in China, Korea, Japan, and India. He has authored or coauthored more than 700 technical articles and ten patents.
Dr. Pecht is a Professional Engineer, an ASME Fellow, an SAE Fellow, and an IMAPS Fellow. He served as an Editor-in-Chief for the IEEE Access for six years, as an Editor-in-Chief for the IEEE Transactions on Reliability for nine years, and an Editor-in-Chief for the Microelectronics Reliability for 16 years. He has also served on three U.S. National Academy of Science studies, two US Congressional investigations in automotive safety, and as an expert to the U.S. FDA. He is the Director of Center for Advanced Life Cycle Engineering, University of Maryland, which is funded by more than 150 of the world's leading electronics companies at more than US$6 M/year. He is also a Chair Professor. In 2010, he was the recipient of the IEEE Exceptional Technical Achievement Award and in 2008, and the IEEE Reliability Society's Lifetime Achievement Award.
Michael G. Pecht (S’78–M’83–SM’90–F’92) received the B.S. degree in physics, the M.S. degree in electrical engineering and the M.S. and Ph.D. degrees in engineering mechanics from the University of Wisconsin, Madison, WI, USA, in 1976, 1978, 1979, and 1982, respectively.
He has authored or coauthored more than 20 books on product reliability, development, use and supply chain management. He has also authored or coauthored a series of books of the electronics industry in China, Korea, Japan, and India. He has authored or coauthored more than 700 technical articles and ten patents.
Dr. Pecht is a Professional Engineer, an ASME Fellow, an SAE Fellow, and an IMAPS Fellow. He served as an Editor-in-Chief for the IEEE Access for six years, as an Editor-in-Chief for the IEEE Transactions on Reliability for nine years, and an Editor-in-Chief for the Microelectronics Reliability for 16 years. He has also served on three U.S. National Academy of Science studies, two US Congressional investigations in automotive safety, and as an expert to the U.S. FDA. He is the Director of Center for Advanced Life Cycle Engineering, University of Maryland, which is funded by more than 150 of the world's leading electronics companies at more than US$6 M/year. He is also a Chair Professor. In 2010, he was the recipient of the IEEE Exceptional Technical Achievement Award and in 2008, and the IEEE Reliability Society's Lifetime Achievement Award.View more