Abstract:
This paper presents a self-checking scheme for the on-line testing and diagnosis of intermediate voltage values affecting bus lines because of resistive bridging faults, ...Show MoreMetadata
Abstract:
This paper presents a self-checking scheme for the on-line testing and diagnosis of intermediate voltage values affecting bus lines because of resistive bridging faults, or different kinds of faults affecting the bus connected units. Our scheme is self-checking with respect to a wide set of possible internal faults, including node stuck-ats, transistors stuck-on, transistors stuck-open, resistive bridgings, crosstalks, delays and transient faults.
Published in: Proceedings 2000 IEEE International Workshop on Defect Based Testing (Cat. No.PR00637)
Date of Conference: 30-30 April 2000
Date Added to IEEE Xplore: 06 August 2002
Print ISBN:0-7695-0637-2
Keywords assist with retrieval of results and provide a means to discovering other relevant content. Learn more.
- IEEE Keywords
- Index Terms
- Online Assessment ,
- Diagnosis Strategies ,
- Bus Lines ,
- Online Diagnosis ,
- Transient Faults ,
- Conductive ,
- Operating System ,
- System Performance ,
- False Alarm ,
- Global Strategy ,
- Inverter ,
- Diagnosis Of Conditions ,
- Detection Conditions ,
- CMOS Technology ,
- Internal Defects ,
- Reliability Requirements ,
- Online Detection ,
- Kinds Of Defects ,
- Area Overhead ,
- Rising Edge
Keywords assist with retrieval of results and provide a means to discovering other relevant content. Learn more.
- IEEE Keywords
- Index Terms
- Online Assessment ,
- Diagnosis Strategies ,
- Bus Lines ,
- Online Diagnosis ,
- Transient Faults ,
- Conductive ,
- Operating System ,
- System Performance ,
- False Alarm ,
- Global Strategy ,
- Inverter ,
- Diagnosis Of Conditions ,
- Detection Conditions ,
- CMOS Technology ,
- Internal Defects ,
- Reliability Requirements ,
- Online Detection ,
- Kinds Of Defects ,
- Area Overhead ,
- Rising Edge
