I. Introduction
Switching DC-DC converters are widely used in today's electronic systems due to their high efficiency compared to linear power electronics. However, one of major challenges in the switching converters is to model and predict voltage noise caused by the nature of high and during the switching activities [1], [2]. Synchronous buck converter is one of the most popular topologies for switched-mode power supply. The voltage noise can cause functional failures and timing errors in the digital and mixed-signal systems as well as broadband electromagnetic interference (EMI) [3]–[5]. Especially for high-speed systems, the voltage noise generated from switching power suppliers can propagate through power deliver network (PDN) and cause voltage fluctuations for critical chips [6]. Those power fluctuations could significantly degrade the qualities of high-speed signals in terms of high jitter and high bit error rate [7].