Possibilities of a model performance improvement for the calibration-free temperature measurement based on pn-junctions

An accurate calibration-free temperature measurement can be realized, when the pn-junction i-u characteristic is described with a model considering the occurring secondary semiconductor effects. In this paper we give a survey of adapted physically based pn-junction i-u characteristic models, such as the Ebers-Moll/sub 2/, the Ebers-Moll/sub 3/ and the Gummel-Poon model. Furthermore, we build new models through polynomial extensions to the fundamental Shockley model. The considered models were compared with regard to the application of calibration-free temperature measurement. Experimental results show an accuracy enhancement with both physically and mathematically improved models.