I. Introduction
There are many reasons why designers of electromagnetic equipment would want to know the value of magnetic field or inductive electric field on the surfaces of conductors in the system. For example, in high-current pulsed power devices, magnetic induction exceeding the characteristic induction can cause problems [1]. For example, for induction above approximately 43 T for copper, diffusion becomes significantly nonlinear. In many cases, this process is undesirable, as it can result in enhanced flux loss, surface melting and plasma creation, and magnetohydrodynamic (MHD) motion. For superconductors, one usually wants to keep the surface fields below the critical field to avoid transition out of the superconducting state.