Effectiveness of TMR-Based Techniques to Mitigate Alpha-Induced SEU Accumulation in Commercial SRAM-Based FPGAs | IEEE Journals & Magazine | IEEE Xplore

Effectiveness of TMR-Based Techniques to Mitigate Alpha-Induced SEU Accumulation in Commercial SRAM-Based FPGAs


Abstract:

We present an experimental analysis of alpha-induced soft errors in 90-nm low-end SRAM-based FPGAs. We first assess the relative sensitivity of the configuration memory ...Show More

Abstract:

We present an experimental analysis of alpha-induced soft errors in 90-nm low-end SRAM-based FPGAs. We first assess the relative sensitivity of the configuration memory bits controlling the different resources in the FPGA. We then study how SEU accumulation in the configuration memory impacts on the reliability of unhardened and hardened-by-design circuits. We analyze different hardening solutions comprising the use of a single voter, multiple voters, and feedback voters implemented with a commercial tool. Finally, we present an analytical model to predict the failure rate as function of the number of bit-flips in the configuration memory.
Published in: IEEE Transactions on Nuclear Science ( Volume: 55, Issue: 4, August 2008)
Page(s): 1968 - 1973
Date of Publication: 31 August 2008

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Cites in Papers - |

Cites in Papers - IEEE (9)

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1.
Luca Sterpone, Sarah Azimi, Ludovica Bozzoli, Boyang Du, Thomas Lange, Maximilien Glorieux, Dan Alexandrescu, Cesar Boatella Polo, David Merodio Codinachs, "A Novel Error Rate Estimation Approach forUltraScale+ SRAM-based FPGAs", 2018 NASA/ESA Conference on Adaptive Hardware and Systems (AHS), pp.120-126, 2018.
2.
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3.
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5.
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6.
Zana Ghaderi, Seyed Ghassem Miremadi, Hossein Asadi, Mahdi Fazeli, "HAFTA: Highly Available Fault-Tolerant Architecture to Protect SRAM-Based Reconfigurable Devices Against Multiple Bit Upsets", IEEE Transactions on Device and Materials Reliability, vol.13, no.1, pp.203-212, 2013.
7.
Huang Zuguang, Yin Zhenyu, Zhao Qinzhi, Zhang Chengrui, "Research and Design of TMR-based Fault Tolerance System for CNC", 2012 IEEE 12th International Conference on Computer and Information Technology, pp.1025-1028, 2012.
8.
Aitor Morillo, Armando Astarloa, Jesús Lázaro, Unai Bidarte, Jaime Jimenez, "Reliable microprocessors for FPGAs: State of the art and trends", 2010 International Conference on Applied Electronics, pp.1-6, 2010.
9.
Zhong-Ming Wang, Li-Li Ding, Zhi-Bin Yao, Hong-Xia Guo, Hui Zhou, Min Lv, "The reliability and availability analysis of SEU mitigation techniques in SRAM-based FPGAs", 2009 European Conference on Radiation and Its Effects on Components and Systems, pp.497-503, 2009.

Cites in Papers - Other Publishers (7)

1.
Shanshan Wang, Jinning Zhang, Wenjun Han, "Reinforcement design of radar pulse compression algorithm in space-borne environment", The Journal of Engineering, vol.2019, no.19, pp.6255-6258, 2019.
2.
P. Reviriego, M. Demirci, J. Tabero, A. Regadío, J.A. Maestro, "DMR+: An efficient alternative to TMR to protect registers in Xilinx FPGAs", Microelectronics Reliability, vol.63, pp.314, 2016.
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Lucas A. Tambara, Felipe Almeida, Paolo Rech, Fernanda L. Kastensmidt, Giovanni Bruni, Christopher Frost, Applied Reconfigurable Computing, vol.9040, pp.331, 2015.
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Sheng Wang, Adrian Evans, Shi-Jie Wen, Rick Wong, GengSheng Chen, "New insights into the impact of SEUs in FPGA CRAMs", IEICE Electronics Express, vol.12, no.6, pp.20150110, 2015.
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D. Sabena, M. Sonza Reorda, L. Sterpone, P. Rech, L. Carro, "Evaluating the radiation sensitivity of GPGPU caches: New algorithms and experimental results", Microelectronics Reliability, vol.54, no.11, pp.2621, 2014.
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Gilles Foucard, Paul Peronnard, Raoul Velazco, "Reliability Limits of TMR Implemented in a SRAM-based FPGA: Heavy Ion Measures vs. Fault Injection Predictions", Journal of Electronic Testing, vol.27, no.5, pp.627, 2011.
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G. Cellere, A. Paccagnella, M. Murat, J. Barak, A. Akkerman, R. Harboe-Sorensen, A. Virtanen, A. Visconti, M. Bonanomi, "Impact of time and space evolution of ion tracks in nonvolatile memory cells approaching nanoscale", Journal of Applied Physics, vol.108, no.12, pp.124907, 2010.

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