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Quantized Hall resistance measurements | IEEE Journals & Magazine | IEEE Xplore

Abstract:

The quantized Hall resistances, R/sub H/(4), of Si MOSFETs were measured at approximately=0.5 K in a magnetic field of 15 T. The value of R/sub H/(4) was determined in te...Show More

Abstract:

The quantized Hall resistances, R/sub H/(4), of Si MOSFETs were measured at approximately=0.5 K in a magnetic field of 15 T. The value of R/sub H/(4) was determined in terms of the Commonwealth Scientific and Industrial Research Organization (CSIRO) realization of the SI ohm. A weighted mean of three determinations gave a value for the quantity R/sub H/(4) of (6453.203,36(52)) Omega /sub SI-NML/ which can also be expressed as 6453.2(1.000,000,52(8)) Omega /sub SI-NML/. This R/sub H/(4) value gives a value for h/e/sup 2/ which is about 0.3 p.p.m. larger than the value for h/e/sup 2/ derived from the anomalous moment of the electron, using the quantum electrodynamics (QED) theory.<>
Published in: IEEE Transactions on Instrumentation and Measurement ( Volume: 38, Issue: 2, April 1989)
Page(s): 270 - 275
Date of Publication: 30 April 1989

ISSN Information:

Department of Physics, Gakushuin University, Tokyo, Japan
Department of Physics, Gakushuin University, Tokyo, Japan
Department of Physics, Gakushuin University, Tokyo, Japan
Department of Physics, Gakushuin University, Tokyo, Japan
Division of Applied Physics, National Measurement Laboratory, CSIRO, Sydney, Australia
Device Fundamentals Section, Electro Technical Laboratory, Tsukuba, Ibaraki, Japan
Device Fundamentals Section, Electro Technical Laboratory, Tsukuba, Ibaraki, Japan
Device Fundamentals Section, Electro Technical Laboratory, Tsukuba, Ibaraki, Japan
Device Fundamentals Section, Electro Technical Laboratory, Tsukuba, Ibaraki, Japan

Department of Physics, Gakushuin University, Tokyo, Japan
Department of Physics, Gakushuin University, Tokyo, Japan
Department of Physics, Gakushuin University, Tokyo, Japan
Department of Physics, Gakushuin University, Tokyo, Japan
Division of Applied Physics, National Measurement Laboratory, CSIRO, Sydney, Australia
Device Fundamentals Section, Electro Technical Laboratory, Tsukuba, Ibaraki, Japan
Device Fundamentals Section, Electro Technical Laboratory, Tsukuba, Ibaraki, Japan
Device Fundamentals Section, Electro Technical Laboratory, Tsukuba, Ibaraki, Japan
Device Fundamentals Section, Electro Technical Laboratory, Tsukuba, Ibaraki, Japan
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