Abstract:
The use of logic simulation to facilitate the development of computers, telephone switching processors, and other digital systems has almost become an accepted industrial...Show MoreMetadata
Abstract:
The use of logic simulation to facilitate the development of computers, telephone switching processors, and other digital systems has almost become an accepted industrial practice. In order to improve the quality of the design, to evaluate design alternatives, and to shorten development intervals, logic simulators have found wide-spread applications in design checkout and verification, derivation and validation of fault-detection and fault-isolation tests, and management of design and manufacturing data. Because of this, the efficiency of logic simulation techniques has also become a vital concern among the simulator developers and the users.
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Cites in Papers - |
Cites in Papers - IEEE (4)
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1.
H.J. De Man, "Computer-aided design for integrated circuits: trying to bridge the gap", IEEE Journal of Solid-State Circuits, vol.14, no.3, pp.613-621, 1979.
2.
Fuh-lin Wang, E. Lowe, F. Angeli, "Design of a functional test generator with a functional deductive simulator for digital systems", International Automatic Testing Conference AUTOTESTCON '78., pp.134-142, 1978.
3.
Hugo De Man, "Computer Aided Design : Trying to Bridge the Gap", ESSCIRC 78: 4th European Solid State Circuits Conference - Digest of Technical Papers, pp.28-32, 1978.
4.
A. Miara, N. Giambiasi, "Dynamic and Deductive Fault Simulation", 15th Design Automation Conference, pp.439-443, 1978.
Cites in Papers - Other Publishers (3)
1.
D. Lewin, D. Protheroe, "Digital circuit testing and design for testability", Design of Logic Systems, pp.403, 1992.
2.
Douglas Lewin, "Computer aided design for microcomputer systems", Microcomputer System Design, vol.126, pp.65, 1982.
3.
P. DesMarais, M. Krieger, "Fault simulation and digital circuit testability", Microelectronics Reliability, vol.15, pp.5, 1976.
