A High-Sensitivity Composite Probe Capable of Simultaneously Measuring Electric- and Magnetic-Field Components

This letter presents a high-sensitivity composite probe capable of simultaneously measuring electric- and magnetic-field components. The composite probe contains a U-shaped loop, two parasitic long loops, and a pair of strip lines as a transmission part. First, the U-shaped loop is designed to test both electric and magnetic fields. Second, two parasitic long loops are placed at both sides of the U-shaped loop to increase the sensitivity. Third, to characterize and calibrate the probe, a standard microstrip line is manufactured and used. Finally, the developed probe is printed and tested to prove the feasibility of the design. The tested results indicate that the probe can not only simultaneously test electric and magnetic fields, but also have a wider working bandwidth and higher sensitivity.

I. Introduction

Recently, near-field probes as the core of near-field scanning systems have been massively studied in Baudry [2007], Zhang [2013], Huang [2017], and Shen [2017]. These probes in the scanning system are used to locate the unwanted radiation source and electromagnetic interference (EMI) of high-speed electronic systems [Kanda 1993, Montrose and Nakauchi 2004, Tamaki 2004, Ramdani 2009, Shao 2019, Li 2020, He 2021, Wang 2023a]. Usually, the radiated EMI signals from the device under test are very weak, which means that a probe with high detection sensitivity can capture the weak EMI signals. Thus, it is necessary to study the near-field probe with high detection sensitivity.