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Duan Nie

Publications
5
Citations
9
Publications by Year
20232025
Co-Authors:
Show All Co-Authors (12)
Image of author Duan Nie

Duan Nie

Affiliation

China Electronic Product Reliability and Environmental Testing Research Institute (CEPREI), Guangzhou, China

Publication Topics

Biography

Duan Nie was born in Shaanxi, China, in 1998. She received the B.S. degree in information and computational science from Xi’an University of Science and Technology, Xi’an, Shaanxi, in 2020. She is currently pursuing the M.S. degree in electronic information with Shaanxi University of Science and Technology, Xi’an.,Her current interests include the near-field probe and near-field measurement.(Based on document published on 20 May 2024).
Publications
5
Citations
9
Publications by Year
20232025
Co-Authors:
Show All Co-Authors (12)
Author's Published Works

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Systematic Characterization on a Four-Port Three-Component Near-Field Probing System

Caixu Yu;Lei Wang;Duan Nie;Deren Feng;Jun Luo;Weiheng Shao

IEEE Sensors Journal
Year: 2025 | Volume: 25, Issue: 3 | Journal Article |
The four-port probing system is becoming a popular electromagnetic interference analysis tool due to the release of system symmetry requirements. However, the four-port probing systems lack a systematic characterization method due to the difference between multicomponent and single-component measurement systems. Therefore, based on the previous characterization principles, this article systematica...Show More

Systematic Characterization on a Four-Port Three-Component Near-Field Probing System

Caixu Yu;Lei Wang;Duan Nie;Deren Feng;Jun Luo;Weiheng Shao

Year: 2025 | Volume: 25, Issue: 3 | Journal Article |

Four-Port Asymmetric Correction for Simultaneous Multicomponent EM-Field Measurement

Weiheng Shao;Caixu Yu;Duan Nie;Zhizhe Wang;Xinxin Tian;Lei Wang

IEEE Transactions on Instrumentation and Measurement
Year: 2024 | Volume: 73 | Journal Article |
Cited by: Papers (1)
The electromagnetic field probing system with a multiport probe as a high-efficiency simultaneous multicomponent near-field emission measurement tool has been paid more attention. However, strict symmetry requirements of the electromagnetic near-field (EM-field) probing system limit its applications. In this article, a four-port asymmetric correction method (FPACM) is proven to be effective for an...Show More

Four-Port Asymmetric Correction for Simultaneous Multicomponent EM-Field Measurement

Weiheng Shao;Caixu Yu;Duan Nie;Zhizhe Wang;Xinxin Tian;Lei Wang

Year: 2024 | Volume: 73 | Journal Article |

Four-Port Asymmetric Calibration Method for Simultaneous Measuring Hx, Hy, and Ez

Duan Nie;Wenyuan Liu;Weiheng Shao;Lei Wang;Rui-Qi Wang;Shan Xue

IEEE Sensors Journal
Year: 2024 | Volume: 24, Issue: 10 | Journal Article |
Cited by: Papers (1)
A four-port composite probe with a pair of symmetric cross-orthogonal loops has been verified to measure electric and magnetic fields simultaneously. However, in the near-field measurement, the asymmetry in the transmission path is difficult to avoid and will cause deviations in measurement results. In order to eliminate the asymmetry effectively, a four-port asymmetric calibration method (ACM) is...Show More

Four-Port Asymmetric Calibration Method for Simultaneous Measuring Hx, Hy, and Ez

Duan Nie;Wenyuan Liu;Weiheng Shao;Lei Wang;Rui-Qi Wang;Shan Xue

Year: 2024 | Volume: 24, Issue: 10 | Journal Article |

A New Resonant Composite Probe for Near-field Scanning

Duan Nie;Rui-Qi Wang;Lei Wang

2023 International Conference on Microwave and Millimeter Wave Technology (ICMMT)
Year: 2023 | Conference Paper |
In this article, a new wideband resonant probe with two orthogonal magnetic-field measurement features is proposed. The resonant magnetic-field probe consists of two orthogonal shorted sensing loops, two transmission lines with two outputs, a pair of LC resonant circuits, a shorted via, a connected via, and two rows of coaxial via fences. The LC resonant circuits including a pair of shorted stubs ...Show More

A New Resonant Composite Probe for Near-field Scanning

Duan Nie;Rui-Qi Wang;Lei Wang

Year: 2023 | Conference Paper |

A High-Sensitivity Composite Probe Capable of Simultaneously Measuring Electric- and Magnetic-Field Components

Lei Wang;Duan Nie;Liye Cheng;Hongyue Wang

IEEE Magnetics Letters
Year: 2023 | Volume: 14 | Journal Article |
Cited by: Papers (7)
This letter presents a high-sensitivity composite probe capable of simultaneously measuring electric- and magnetic-field components. The composite probe contains a U-shaped loop, two parasitic long loops, and a pair of strip lines as a transmission part. First, the U-shaped loop is designed to test both electric and magnetic fields. Second, two parasitic long loops are placed at both sides of the ...Show More

A High-Sensitivity Composite Probe Capable of Simultaneously Measuring Electric- and Magnetic-Field Components

Lei Wang;Duan Nie;Liye Cheng;Hongyue Wang

Year: 2023 | Volume: 14 | Journal Article |

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