Abstract:
Electrochemical migration (ECM) is an ongoing reliability issue in the microelectronics industry. ECM is characterized by the presence of dendrites, which form between tw...Show MoreMetadata
Abstract:
Electrochemical migration (ECM) is an ongoing reliability issue in the microelectronics industry. ECM is characterized by the presence of dendrites, which form between two electrodes with a nonzero electric potential difference and can lead to short circuits. This work is focused on the evaluation of the influence of electrode shapes and voltage polarity on dendrite growth. Several combinations of straight, oval, and angular shapes were tested, along with the changing polarity of the applied electric field. Water drop test (WDT) with 1.5 wt.% and 0.01 wt.% NaCl solution was used to examine ECM. The results show a difference in the dendrite growth depending on the electrode’s shapes and the voltage polarity. The longest time to failure (TTF) and the most remarkable differences between the different voltage polarities occurred when the combinations with the angular electrodes were tested.
Date of Conference: 10-14 May 2023
Date Added to IEEE Xplore: 06 July 2023
ISBN Information: