Author details
Author's Published Works
H.W. Alvestad;W.C. Barkley;D.B. Barlow;D.S. Barr;G.A. Bennett;L.J. Bitteker;E. Bjorklund;M.J. Borden;M.J. Burns;G. Carr;J.L. Casados;S. Chacon;S. Cohen;J.F. Cordova;J.A. Faucett;L.E. Fernandez;D. Fitzgerald;M. Fresquez;F.R. Gallegos;R. Garnett;J.D. Gilpatrick;F. Gonzales;F.W. Gorman;M.J. Hall;D.J. Hayden;D. Henderson;G.D. Johns;D. Kerstiens;M.D. Lusk;A.J. Maestas;H.P. Marquez;D. Martinez;M.P. Martinez;J.B. Merrill;R.E. Meyer;E.A. Morgan;A. Naranjo;J.F. O'Hara;F.R. Olivas;M.A. Oothoudt;T.D. Pence;E.M. Perez;C. Pillai;B.J. Roller;A.M. Romero;D.B. Romero;F.P. Romero;G. Sanchez;J.B. Sandoval;S. Schaller;F.E. Shelley;R.B. Shurter;J.R. Sims;J.L. Stockton;J. Sturrock;V.P. Vigil;T. Zaugg;M. Gulley
H.W. Alvestad;W.C. Barkley;D.B. Barlow;D.S. Barr;G.A. Bennett;L.J. Bitteker;E. Bjorklund;M.J. Borden;M.J. Burns;G. Carr;J.L. Casados;S. Chacon;S. Cohen;J.F. Cordova;J.A. Faucett;L.E. Fernandez;D. Fitzgerald;M. Fresquez;F.R. Gallegos;R. Garnett;J.D. Gilpatrick;F. Gonzales;F.W. Gorman;M.J. Hall;D.J. Hayden;D. Henderson;G.D. Johns;D. Kerstiens;M.D. Lusk;A.J. Maestas;H.P. Marquez;D. Martinez;M.P. Martinez;J.B. Merrill;R.E. Meyer;E.A. Morgan;A. Naranjo;J.F. O'Hara;F.R. Olivas;M.A. Oothoudt;T.D. Pence;E.M. Perez;C. Pillai;B.J. Roller;A.M. Romero;D.B. Romero;F.P. Romero;G. Sanchez;J.B. Sandoval;S. Schaller;F.E. Shelley;R.B. Shurter;J.R. Sims;J.L. Stockton;J. Sturrock;V.P. Vigil;T. Zaugg;M. Gulley
M. Oothoudt;S. Schaller;E. Bjorklund;M. Burns;G. Carr;J. Faucett;D. Hayden;M. Lusk;R. Merl;J. Potter;J. Reynolds;D. Romero;F. Shelley
Michael J. Burns;George J. Caporaso;Bruce E. Carlsten;Yu-Jiuan Chen;Ken P. Chow;Edward G. Cook;Harold A. Davis;Carl A. Ekdahl;William M. Fawle;Clifford M. Fortgang;Thomas P. Hughes;B.R. Trent McCuistian;Kurt E. Nielsen;Henry L. Rutkowski;Steve Sampayan;Will L. Waldron;James A. Watson;Glenn A. Westenskow;Simon S. Yu
Michael J. Burns;George J. Caporaso;Bruce E. Carlsten;Yu-Jiuan Chen;Ken P. Chow;Edward G. Cook;Harold A. Davis;Carl A. Ekdahl;William M. Fawle;Clifford M. Fortgang;Thomas P. Hughes;B.R. Trent McCuistian;Kurt E. Nielsen;Henry L. Rutkowski;Steve Sampayan;Will L. Waldron;James A. Watson;Glenn A. Westenskow;Simon S. Yu
M. Burns;H. Kirbie;T. McCuistian;K. Nielsen;H. Rutkowski;W. Waldron;S. Yu;E. Cook;J. Watson
M. Burns;H. Davis;C. Ekdahl;C. Fortgang;H. Kirbie;T. McCuistian;K. Nielsen;K. Chow;W. Fawley;H. Rutkowski;W. Waldron;S. Yu;G. Caporaso;Y.-J. Chen;E. Cook;J. Watson
M.J. Burns;B.E. Carlsten;T.J.T. Kwan;D.C. Moir;D.S. Prono;S.A. Watson;E.L. Burgess;H.L. Rutkowski;G.J. Caporaso;Y.-J. Chen;S. Sampayan;G. Westenskow
T. Kauppila;L. Builta;M. Burns;W. Gregory;D. Honaberger;S. Watson;T. Hughes
M. Burns;P. Allison;J. Downing;D. Moir;G. Caporaso;Y. J. Chen
M. Burns;P. Allison;L. Earley;D. Liska;C. Mockler;J. Ruhe;H. Tucker;L. Walling
L. Walling;P. Allison;M. Burns;D.J. Liska;D.E. McMurry;A.H. Shapiro
M. Burns;K. Chellis;C. Mockler;T. Tucker;G. Velasquez;R. Van Maren
G.A. Deis;M.J. Burns;T.C. Christensen;F.E. Coffield;B. Kulke;D. Prosnitz;E.T. Scharlemann;K. Halbach
T.C. Christensen;M.J. Burns;G.A. Deis;C.D. Parkison;D. Prosnitz;K. Halbach
M.J. Burns;B. Kulke;G.A. Deis;R.W. Frye;J.S. Kallman;C.W. Ollis;G.C. Tyler;R.D. Van Maren;W.C. Weiss
A not-for-profit organization, IEEE is the world's largest technical professional organization dedicated to advancing technology for the benefit of humanity.
© Copyright 2025 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.