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D. Weiler - IEEE Xplore Author Profile

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Author details

D. Weiler

Also published under: Dirk Weiler

Publications

11

Citations

20

Publications by Year

19972017

Co-Authors:

J. AmelungChristian BaumerB. BechenStefan EickLutz Gendrisch

Show All Co-Authors (23)

D. Weiler

Also published under: Dirk Weiler

Affiliation

Fraunhofer Institute for Microelectronic Circuits and Systems (IMS), Duisburg, Germany

Publication Topics

Blackbody,
Absorber Layer,
Communication Protocol,
Critical Success Factors,
Emissivity,
External Power Supply,
Frame Grabber,
Homogeneous Surface,
Infrared Imaging,
Irradiation,
Length In Order,
Manual Testing

Biography

Dirk Weiler is Chairman of the ETSI Board and the ETSI IPR Special Committee, and Head of Standards Management & Horizontal in the Networks Business of Nokia. With 30 years of technical and management experience in the telecoms industry he regularly speaks and writes about standardization, patents and the interplay of both. He holds an advanced degree in physics (Diplom-Physiker) from the University of Cologne.(Based on document published on 10 June 2015).

Publications

11

Citations

20

Publications by Year

19972017

Co-Authors:

J. Amelung
Christian Baumer
B. Bechen
Stefan Eick
Lutz Gendrisch

Show All Co-Authors (23)

Author's Published Works

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Showing 1-11 of 11 results

Conferences (10)

Magazines (1)

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Single Year
D. Weiler(8)
B.J. Hosticka(6)
O. Machul(4)
D. Hammerschmidt(4)
Dirk Weiler(3)
Fraunhofer Institute of Microelectronic Circuits and System, Duisburg, Germany(5)
Fraunhofer Institute for Microelectronic Circuits and Systems (IMS), Duisburg, Germany(2)
IEEE Standards Association(1)
Fraunhofer Institute for Microelectronic Circuits and Systems, Signal Processing and System Design, Duisburg, Germany(1)
Elektronische Bauelemente und Schaltungen (EBS), Faculty University Duisburg-Essen(1)
2000 IEEE International Symposium on Circuits and Systems (ISCAS)(1)
2006 Ph.D. Research in Microelectronics and Electronics(1)
2006 Proceedings of the 32nd European Solid-State Circuits Conference(1)
2007 18th European Conference on Circuit Theory and Design(1)
2011 Numerical Simulation of Optoelectronic Devices(1)
IEEE(11)
Bangkok, Thailand(1)
Duisburg, Germany(1)
Geneva, Switzerland(1)
Montreaux, Switzerland(1)
Otranto, Italy(1)
Quantization Noise(4)
Input Signal(3)
Power Supply Voltage(3)
Blackbody(2)
Clock Phase(2)

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Results

Automating wafer-level test of uncooled infrared detectors using wafer-prober

M. Makhlouf;D. Goller;L. Gendrisch;S. Kolnsberg;F. Vogt;A. Utz;D. Weiler;H. Vogt

2017 IEEE 23rd International Symposium on On-Line Testing and Robust System Design (IOLTS)

Year: 2017 | Conference Paper |

Cited by: Papers (1)

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Fraunhofer IMS develops and fabricates far-infrared focal plane arrays (IRFPA) using microbolometers with a pixel pitch of 17μm technology realized on top of a 0.35 μm CMOS readout integrated circuit (ROIC). The microbolometers are encapsulated by a Chip-Scale-Package (CSP) to ensure a high quality vacuum level. The CSP is realized by placing an infrared transparent lid above a solder frame surrou...Show More

Automating wafer-level test of uncooled infrared detectors using wafer-prober

M. Makhlouf;D. Goller;L. Gendrisch;S. Kolnsberg;F. Vogt;A. Utz;D. Weiler;H. Vogt

2017 IEEE 23rd International Symposium on On-Line Testing and Robust System Design (IOLTS)

Year: 2017 | Conference Paper |

Simulation method for LWIR radiation distribution using a visual ray-tracer

Alexander Utz;Lutz Gendrisch;Dirk Weiler;Stephan Kolnsberg;Holger Vogt

2011 Numerical Simulation of Optoelectronic Devices

Year: 2011 | Conference Paper |

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Infrared cameras with passive, uncooled sensor chips utilize the longwave-infrared (LWIR) range of the electromagnetic spectrum with wavelength between 8 and 14μm for image generation. The reason for this is that every object is self-luminous at room temperature at that wavelength. Therefore, every surface acts as a source of radiation in an LWIR scenario. To gain an impression and to model the ef...Show More

Simulation method for LWIR radiation distribution using a visual ray-tracer

Alexander Utz;Lutz Gendrisch;Dirk Weiler;Stephan Kolnsberg;Holger Vogt

2011 Numerical Simulation of Optoelectronic Devices

Year: 2011 | Conference Paper |

Theoretical and practical minimum of the power Consumption of 3 ADCs in SC technique

B. Bechen;T. v. d. Boom;D. Weiler;B. J. Hosticka

2007 18th European Conference on Circuit Theory and Design

Year: 2007 | Conference Paper |

Cited by: Papers (10)

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In this paper the theoretical and practical minimum of the power consumption is investigated for 3 ADC architectures, which are predestined for low conversion speed and applications in low-power sensor readout circuits. The analysis is made for the switched capacitor versions of the SAR ADC, cyclic ADC and sigma-delta modulator. The theoretical limit of the power efficiency is investigated by a co...Show More

Theoretical and practical minimum of the power Consumption of 3 ADCs in SC technique

B. Bechen;T. v. d. Boom;D. Weiler;B. J. Hosticka

2007 18th European Conference on Circuit Theory and Design

Year: 2007 | Conference Paper |

Design and Evaluation of a CMOS-Photosensor with In-Pixel Sigma-Delta Modulator for X-ray Computed Tomography

Christian Baumer;Stefan Eick;Roger Steadman;Gereon Vogtmeier;Michael Gnade;Armin Kemna;Dirk Weiler

2006 Proceedings of the 32nd European Solid-State Circuits Conference

Year: 2006 | Conference Paper |

Cited by: Papers (8) | Patents (2)

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A multichannel SigmaDelta-type analog-to-digital converter has been designed for data readout in CT scanners. A test-structure with a 4 times 4 photodetector array has been fabricated in a 0.8 mum CMOS process. Aiming at an integrated solution towards a 'digital pixel', each sensor element is formed by a photodiode and a third-order SigmaDelta-modulator. The switched-capacitor circuitry has been r...Show More

Design and Evaluation of a CMOS-Photosensor with In-Pixel Sigma-Delta Modulator for X-ray Computed Tomography

Christian Baumer;Stefan Eick;Roger Steadman;Gereon Vogtmeier;Michael Gnade;Armin Kemna;Dirk Weiler

2006 Proceedings of the 32nd European Solid-State Circuits Conference

Year: 2006 | Conference Paper |

A Very Low-Power CMOS 11-b Cyclic A/D Converter with Mismatch Compensation

B. Bechen;T. v. d. Boom;D. Weiler;B.J. Hosticka

2006 Ph.D. Research in Microelectronics and Electronics

Year: 2006 | Conference Paper |

Cited by: Papers (1)

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A 11-b CMOS cyclic A/D converter with very low-power consumption is presented. A method to reduce the effect of component mismatch is introduced, which significantly improves the accuracy. The improvement has been confirmed by simulations.Show More

A Very Low-Power CMOS 11-b Cyclic A/D Converter with Mismatch Compensation

B. Bechen;T. v. d. Boom;D. Weiler;B.J. Hosticka

2006 Ph.D. Research in Microelectronics and Electronics

Year: 2006 | Conference Paper |

Resolution prediction for bandpass-/spl Sigma//spl Delta/-modulators using SIMULINK behavior simulation

D. Weiler;T. van den Boom;B.J. Hosticka

Proceedings of the 2003 International Symposium on Circuits and Systems, 2003. ISCAS '03.

Year: 2003 | Conference Paper |

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This paper presents a detailed survey of the impact of circuit non-idealities of bandpass sigma-delta modulators (BP-/spl Sigma//spl Delta/M) affecting the signal-to-noise and distortion ratio (SNDR) and therefor the resolution. The presented results have been developed using SIMULINK behavior simulations of a second order BP-/spl Sigma//spl Delta/M. A behavior simulation has the advantage of a fa...Show More

Resolution prediction for bandpass-/spl Sigma//spl Delta/-modulators using SIMULINK behavior simulation

D. Weiler;T. van den Boom;B.J. Hosticka

Proceedings of the 2003 International Symposium on Circuits and Systems, 2003. ISCAS '03.

Year: 2003 | Volume: 1 | Conference Paper |

Detection of defective sensor elements using /spl Sigma//spl Delta/-modulation and a matched filter

D. Weiler;O. Machul;D. Hammerschmidt;B.J. Hosticka

Proceedings Design, Automation and Test in Europe Conference and Exhibition 2000 (Cat. No. PR00537)

Year: 2000 | Conference Paper |

We present an integrable solution for the detection of defective sensor elements using sigma-delta-(/spl Sigma//spl Delta/)-modulation and a matched filter. The sensor element is stimulated using a pseudo random binary sequence (PRBS). The sensor signal is read out and the analog output is digitized using a /spl Sigma//spl Delta/-modulator. The binary pulse density stream of the /spl Sigma//spl De...Show More

Detection of defective sensor elements using /spl Sigma//spl Delta/-modulation and a matched filter

D. Weiler;O. Machul;D. Hammerschmidt;B.J. Hosticka

Proceedings Design, Automation and Test in Europe Conference and Exhibition 2000 (Cat. No. PR00537)

Year: 2000 | Conference Paper |

Nonlinear function generation using oversampled /spl Sigma//spl Delta/-modulators

O. Machul;D. Hammerschmidt;D. Weiler;B.J. Hosticka

2000 IEEE International Symposium on Circuits and Systems (ISCAS)

Year: 2000 | Conference Paper |

In this paper we present a technique for nonlinear function generation which uses a novel sparse look-up table approach. This novel approach can be derived from the simple look-up table concept and utilizes the interpolating properties of oversampled /spl Sigma//spl Delta/-modulators. We show that the approximation process with oversampled /spl Sigma//spl Delta/-modulators can be generally underst...Show More

Nonlinear function generation using oversampled /spl Sigma//spl Delta/-modulators

O. Machul;D. Hammerschmidt;D. Weiler;B.J. Hosticka

2000 IEEE International Symposium on Circuits and Systems (ISCAS)

Year: 2000 | Volume: 1 | Conference Paper |

An absolute air pressure smart sensor family with 2 dimensional calibration

D. Weiler;O. Machul;J. Amelung;D. Hammerschmidt;B.J. Hosticka

Proceedings of the 25th European Solid-State Circuits Conference

Year: 1999 | Conference Paper |

Cited by: Patents (1)

We present a monolithic pressure transducer family with on-chip pressure sensor, readout, linearization, and temperature compensation reaching an 1% accuracy after calibration. Temperature compensation and linearization are realized by two dimensional pwl interpolation using ΣΔ-modulators. This accuracy requires only a few calibration points for full pressure and temperature range. A prototype sen...Show More

An absolute air pressure smart sensor family with 2 dimensional calibration

D. Weiler;O. Machul;J. Amelung;D. Hammerschmidt;B.J. Hosticka

Proceedings of the 25th European Solid-State Circuits Conference

Year: 1999 | Conference Paper |

Single bit sigma-delta modulator with nonlinear quantization for µ-law coding

D. Weiler;P.A. Nielsen;D. Hammerschmidt;O. Machul;B.J. Hosticka

Proceedings of the 23rd European Solid-State Circuits Conference

Year: 1997 | Conference Paper |

Cited by: Patents (3)

This paper presents a 1st order sigma-delta-modulator with µ-law coding for dynamic compression of audio signals. The nonlinearity is located in the feedback loop of the modulator and does not require an internal multibit A/D converter. The modulator requires just one opamp, one comparator, and a minimum of digital logic to generate a four bit feedback and to ensure a stable operation. The µ-law-f...Show More

Single bit sigma-delta modulator with nonlinear quantization for µ-law coding

D. Weiler;P.A. Nielsen;D. Hammerschmidt;O. Machul;B.J. Hosticka

Proceedings of the 23rd European Solid-State Circuits Conference

Year: 1997 | Conference Paper |

Commentary

Bruce Kraemer;Olaf Kolkman;Dirk Weiler

IEEE Communications Magazine

Year: 2015 | Volume: 53, Issue: 6 | Magazine Article |

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Commentary

Bruce Kraemer;Olaf Kolkman;Dirk Weiler

IEEE Communications Magazine

Year: 2015 | Volume: 53, Issue: 6 | Magazine Article |

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