Author details
Author's Published Works
Scheduled Maintenance on Monday 1/13/2025
Single article sales and account management will be unavailable from 5:00 AM - 7:00 PM ET (09:00 - 23:00 UTC). We apologize for the inconvenience.
Hae Won Jung;Seoung Hun Lee;Kyong Hon Kim;Dong Wook Kim;Vijay Manohar Deshmukh;Min Hee Lee
Joon Tae Ahn;Hong-Seok Seo;Woon Jin Chung;Bong Je Park;Kyong Hon Kim
Joon Tae Ahn;Hong-Seok Seo;Woon Jin Chung;Bong Je Park;Kyong Hon Kim
Joon Tae Ahn;S. Park;Jung Yun Do;Jong-Moo Lee;Myung-Hyun Lee;Kyong Hon Kim
Jong-Moo Lee;S. Park;Myung-Hyun Lee;Joon Tae Ahn;Jung Jin Ju;Kyong Hon Kim
Yong Gyu Choi;Bong Je Park;Doo Hee Cho;Hong Seok Seo;Joon Tae Ahn;Kyong Hon Kim
Joon Tae Ahn;Jong Moo Lee;Hong-Seok Seo;Yongsoon Baek;Moon Ho Park;Kyong Hon Kim
Do Il Chang;Dong Sung Lim;Min Yong Jeon;Hak Kyu Lee;Kyong Hon Kim;Taesang Park;W. Shin;K. Oh
Min-Yong Jeon;Dong Sung Lim;Hak Kyu Lee;Joon Tae Ahn;Do Il Chang;Kyong Hon Kim;Seung Beom Kang
Do Il Chang;Dong Sung Lim;Min Yong Jeon;Hak Kyu Lee;Kyong Hon Kim
Joou Tae Ahn;Hak Kyu Lee;Min-Yong Jeon;Dong Sung Lim;Kyong Hon Kim
Hak Kyu Lee;Kyong Hon Kim;Min Yong Jeon;Joon Tae Ahn;Dong Sung Lim
Min-Yong Jeon;Hak Kyu Lee;Joon Tae Ahn;Dong Sung Lim;Do Il Chang;Kyong Hon Kim
Min-Yong Jeon;Hak Kyu Lee;Joon Tae Ahn;Dong Sung Lim;Do Il Chang;Kyong Hon Kim
Min-Yong Jeon;Hak Kyu Lee;Joon Tae Ahn;Dong Sung Lim;Ho Young Kim;Kyong Hon Kim;El-Hang Lee
Hak Kyu Lee;Chang Hee Lee;Seung Bum Kang;Min-Yong Jeon;Kyong Hon Kim;Dong Sung Lim;Joon Tae Ahn;Ho Young Kim;El-Hang Lee
Min-Yong Jeon;Hak Kyu Lee;Kyong Hon Kim;El-Hang Lee;Wang-Yuhl Oh;Byoung Yoon Kim;Hai-Woong Lee
Hak Kyu Lee;Kyong Hon Kim;Min-Yong Jeon;Joon Tae Ahn;El-Hang Lee
Kyong Hon Kim;Hak Kyu Lee;Joon Tae Ahn;Min-Yong Jeon;Ho Young Kim;Dong Sung Lim;El-Hang Lee
Joon Tae Ahn;Hak Kyu Lee;Kyong Hon Kim;Min-Young Jeon;Ho Young Kim;Dong Sung Lim;El-Hang Lee
A not-for-profit organization, IEEE is the world's largest technical professional organization dedicated to advancing technology for the benefit of humanity.
© Copyright 2025 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.
Test Whats new message.