IEEE Control Systems Letters

Aims & Scope

The IEEE Control Systems Letters (L-CSS) publishes brief articles that provide a concise account of innovative ideas regarding the theory, design, and applications of all aspects of control engineering. The journal aims at ensuring rapid dissemination of the most recent results in the broad field of systems and control.

Publishing Policies

This publication considers original works that enhance the existing body of knowledge. Original review articles and surveys are acceptable, even if new data/concepts are not presented. Results described in the article should not have been submitted or published elsewhere. Expanded versions of conference publications may be submitted. Articles must be intelligible and must be written in standard English.

Peer review is vital to the quality of published research. Each article submitted to IEEE is evaluated by at least two independent reviewers selected by a member of the publication's editorial board. Learn more about the IEEE peer review process. The articles in this journal are peer reviewed in accordance with the requirements set forth in the IEEE PSPB Operations Manual (sections 8.2.1.C & 8.2.2.A). Each published article was reviewed by a minimum of two independent reviewers using a single and/or double anonymous peer review process, where the identities of the reviewers are not known to the authors, but the reviewers know the identities of the authors. Articles will be screened for plagiarism before acceptance.

This publication is supported by subscriptions and applicable Article Processing Charges (APCs). Although there is no cost for publishing with IEEE, authors may wish to take advantage of some of our fee-based offerings; visit the IEEE Author Center for more information on available options.

Authors who have detected an error in their published article should contact the Editor-in-Chief shown above to request the publication of a correction. Note that no change may be made to the original article after it is published in IEEE Xplore.