A Refractive INdex Gradient (RING) diagnostic for transient discharges or expansions of vapor or plasmas

The refractive index gradient (RING) diagnostic described uses a fast, silicon, photodiode quadrant detector with a differential amplifier to temporally detect the refraction of a CW laser by transient discharges or expansions of vapor, gas, or plasma. The method is a local one-dimensional time-resolved, quantitative, species-discriminating (i.e., atoms or electrons) Schlieren technique. The diagnostic is easy to field, sensitive (the minimum deflection angles detectable are approximately=0.3 mu rad), and fast (risetime=11+or-1 ns). Circuit design, performance, and diagnostic theory are discussed. To illustrate the utility of this technique, examples of measurements on LEVIS (laser evaporation ion source), a laser-produced, active, lithium ion source, are given. Measured properties include vapor/plasma production thresholds, expansion velocities, and time-resolved gradient and density spatial profiles. Comparisons of the RING results with measurements using a Faraday cup and a double-floating Langmuir probe are presented.<>