I. Introduction
As both operating frequencies and integration densities increase, the electromagnetic (EM) compatibility of multi-functional and compact high-speed electronic systems becomes more and more important [1], [2], [3]. For the analysis and design of electromagnetic compatibility, the technique of near-field scanning is usually used as an effective way of diagnosing electromagnetic interference (EMI) sources and predicting far-field radiation for high-speed electronic systems [4], [5]. Near-field electromagnetic probes are key components for near-field scanning systems [6], [7], whose performance determines the accuracy and efficiency of near-field scanning.