I. Introduction
Semiconductor technology has been a foundation of scientific progress, societal development and economic growth since decades. Test methods are a main pillar of this technology and are an essential prerequisite for obtaining high-quality products, from low-cost consumer segment to enormously complex and safety-critical installations, at reasonable cost. As a scientific area, test methods are currently undergoing a transformation triggered by the advent of next-generation artificial intelligence technology. Therefore, a new, radically interdisciplinary and large-scale research effort is needed to enable the products of tomorrow and meet the needs of their makers.