Black-Box DC-DC Integrated Circuit Modeling towards Design for EMC in Automotive Electronics | IEEE Conference Publication | IEEE Xplore

Black-Box DC-DC Integrated Circuit Modeling towards Design for EMC in Automotive Electronics


Abstract:

Recently, IoT and sensor networks have developed rapidly and design for EMC has become challenging. In automotive electronics, V2X technology that enables Advanced Driver...Show More

Abstract:

Recently, IoT and sensor networks have developed rapidly and design for EMC has become challenging. In automotive electronics, V2X technology that enables Advanced Driver Assistance Systems (ADAS) has led to stringent EMC requirements for in-vehicle equipment. Therefore, in addition to noise countermeasure technology, it is becoming important to predict EMC risk. Simulation is an effective method to analyze and monitor EMI/EMC performance right from the early design stage, such that possible upstream problems can be addressed in a cost-effective manner. A primary challenge towards such a simulation methodology is the non-availability of models for Integrated Circuits which are the sources of noise. In this work, by measuring the EMC characteristics of the DC-DC converter IC from outside, a macro-model is created without including any proprietary information of the IC interior. This is combined with an electromagnetic simulation framework to generate system-level EMC results. The proposed model-based simulation methodology is validated with measurements for a DC-DC converter system.
Date of Conference: 26 July 2021 - 13 August 2021
Date Added to IEEE Xplore: 19 October 2021
ISBN Information:
Conference Location: Raleigh, NC, USA

I. Introduction

With the recent proliferation of IoT and sensor networks, Electromagnetic Interference (EMI) and Electromagnetic Compatibility (EMC) design considerations are rapidly gaining in importance. In automotive electronics, V2X technology that enables Advanced Driver Assistance Systems (ADAS) has led to stringent EMC requirements for in-vehicle equipment. Therefore, in addition to noise countermeasure technology, it is becoming important to predict EMC risk that might occur upstream.

References

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