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1076.4-2000 - IEEE Standard VITAL ASIC (Application Specific Integrated Circuit) Modeling Specification | IEEE Standard | IEEE Xplore

1076.4-2000 - IEEE Standard VITAL ASIC (Application Specific Integrated Circuit) Modeling Specification

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Abstract:

The VITAL (VHDL Initiative Towards ASIC Libraries)ASIC Modeling Specification is defined in this standard.This modeling specification defines a methodology which promotes...Show More
Scope:To provide a standard method of modeling ASICs in VHDL. This method is aimed at providing efficient, accurate, and tool independent simulation suitable for large chip-lev...Show More
Purpose:Current industry methods for designing complex chip-level designs rely on proprietary solutions which are based on specific commercial tools. This standard provides an ef...Show More

Abstract:

The VITAL (VHDL Initiative Towards ASIC Libraries)ASIC Modeling Specification is defined in this standard.This modeling specification defines a methodology which promotes the development of highly accurate, efficient simulation models for ASIC (Application-Specific Integrated Circuit)components in VHDL.
Scope:
To provide a standard method of modeling ASICs in VHDL. This method is aimed at providing efficient, accurate, and tool independent simulation suitable for large chip-level designs typical of those which are based on ASICs.
Purpose:
Current industry methods for designing complex chip-level designs rely on proprietary solutions which are based on specific commercial tools. This standard provides an effective means of performing those designs in a standard, non-proprietary manner that is independent of specific tools. This promotes cost effective design flows and promotes healthy levels of competition in the electronic design industry. This standard builds on the work of IEEE 1076 VHDL which is a standard hardware description language designed to allow such tool independent electronic design.
Date of Publication: 28 September 2001
Electronic ISBN:978-1-5044-5727-9
Persistent Link: https://xplorestaging.ieee.org/servlet/opac?punumber=7574

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