I. Introduction
Shunt capacitor banks (SCBs) are used in electric power systems as an economical solution for reactive power support, power factor improvement and enhancement of steady state power transmission capacity [1], [2]. The SCB resides a large number of capacitor elements, typically in the range of several hundreds to a couple of thousands. The capacitor elements are connected in series and parallel to form a bank, and the number of elements in series and parallel depends on the voltage and reactive power rating of the bank. Failure of a capacitor element causes voltage stress and overcurrent in remaining elements in the SCB [3]. Such an event may lead to damage the dielectric material of healthy elements that may further cause the hazard of explosion or fire. Therefore, a sensitive protection of SCB is required that provides reliable and efficient operation. Further, the idea of location and number of faulted capacitor elements help in expedition of maintenance process and fast service restoration of the SCB.