Impact Statement:On-chip spectral monitoring for densely packed multi-carrier superchannels in flex grid architectures across the entire C-band remain challenging. The design of a compact...Show More
Abstract:
Monitoring the state of the optical network is a key enabler for programmability of network functions, protocols and efficient use of the spectrum. A particular challenge...Show MoreMetadata
Impact Statement:
On-chip spectral monitoring for densely packed multi-carrier superchannels in flex grid architectures across the entire C-band remain challenging. The design of a compact on-chip high resolution spectrometer for broad band operation is proposed and verified by industry standard simulation tools. The target application is to measure the spectral profile of a WDM signals accurately in flex and fixed grid architectures across the entire C-band 1530 nm-1565 nm aiming at sub-GHz resolution bandwidth
Abstract:
Monitoring the state of the optical network is a key enabler for programmability of network functions, protocols and efficient use of the spectrum. A particular challenge is to provide the SDN-EON controller with a panoramic view of the complete state of the optical spectrum. This paper describes an architecture for compact on-chip spectrometry targeting high resolution across the entire C-band to reliably and accurately measure the spectral profile of WDM signals in fixed and flex-grid architectures. An industry standard software tool is used to validate the performance of the spectrometer. The fabrication of the proposed design is found to be practical.
Published in: IEEE Photonics Journal ( Volume: 12, Issue: 5, October 2020)
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