Abstract:
W.C. Kotheimer comments on the paper by U.D. Annakkage et al. (see ibid., vol.15, no.1, p.57-61, 2000). The author points out that the original authors have identified an...Show MoreMetadata
Abstract:
W.C. Kotheimer comments on the paper by U.D. Annakkage et al. (see ibid., vol.15, no.1, p.57-61, 2000). The author points out that the original authors have identified an apparent limitation of the Jiles-Atherton algorithm using the Langevin function when used to model the core of a current transformer subjected to high fault currents in the presence of a significant amount of remanence. The original authors reply to the comments.
Published in: IEEE Transactions on Power Delivery ( Volume: 15, Issue: 4, October 2000)
DOI: 10.1109/61.891531
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Cites in Papers - IEEE (3)
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Shuaipeng Wang, Chunguang Lu, Lei Song, Yanning Chen, Zhen Fu, Fang Liu, Haichao Huang, "Research on characteristics of a high precision current sensor", 2022 23rd International Conference on Electronic Packaging Technology (ICEPT), pp.1-4, 2022.
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Fuyong Chen, Ye Chen, Tong Han, Cong Lin, Ming Cao, Jun Sun, Shuai Yang, "Simulation Analysis about Anti-DC Effect of Current Transformer with Air Gapped Core", 2021 International Conference on Electrical Materials and Power Equipment (ICEMPE), pp.1-4, 2021.
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Ke Wang, Gang Li, Shuqi Zhang, Jinzhong Li, Jinyuan Liu, Xinwang Wu, Haitao Yang, Xiaobo Hu, "Research on Residual Flux Characteristics of Transformer with Single-Phase Four-Limb Core Under Different DC Excitation Current", 2020 IEEE International Conference on High Voltage Engineering and Application (ICHVE), pp.1-5, 2020.
Cites in Papers - Other Publishers (2)
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Rajesh Velpula, Nareddy Nageswara Reddy, S. Venakata Hareesh, Raja Pitchaimuthu, "A simple approach for the protection of EHV transmission lines", Electric Power Systems Research, vol.224, pp.109744, 2023.
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Xuanwei Qi, Yutian Ye, Song Wang, Chengyu Lu, Xiaohua Xuan, Minghao Wen, "The practical CT transient simulation model based on dynamic tests and its application", IEEJ Transactions on Electrical and Electronic Engineering, vol.14, no.2, pp.221, 2019.
