I. Introduction
Phase retrieval (PR) is an important problem that arises in numerous applications, where only intensity measurements are available, such as astronomical imaging [1], microscopy [2], X-ray crystallography [3], and diffractive optical imaging (DOI) [4]. A recent scheme, called coded diffraction patterns (CDP), has attracted attention since it modifies the traditional DOI system by modulating the object and then collecting the intensity of its diffraction pattern [5], [6].