A Review of Xilinx Field Programmable Gate Array Radiation Effects Performance Part II

Single event effects and total dose performance trends of multiple generations of Xilinx FPGAs are reviewed. Their performance is compared to typical space mission requirements.

I. Introduction

IN this paper, device characteristics, single event effects and total dose performance trends of multiple generations of Xilinx field programmable gate arrays (FPGAs) are reviewed. The approach followed to characterize single event upset (SEU) susceptibility using proton irradiation is described. Their single event latchup (SEL) and total dose performance is compared to typical space mission requirements. Upset rates in the space radiation environment for typical space mission parameters are estimated for the latest generation of device.