Abstract:
This paper presents the results obtained from a study conducted to evaluate the long-term operational reliability of DC-DC power converters used in computer applications....Show MoreMetadata
Abstract:
This paper presents the results obtained from a study conducted to evaluate the long-term operational reliability of DC-DC power converters used in computer applications. A full-bridge, phase-shifted zero voltage switching (ZVS) PWM converter was investigated experimentally and theoretically. It is shown that under low-load conditions, the intrinsic body diode of the MOSFET undergoes dynamic avalanching during its reverse recovery with an associated high dV/dt. This phenomenon results in an excessive power loss in the circuit and increased switching stress for the MOSFET. The converter failure under low-load conditions can be associated with this mechanism as one of the potential causes.
Date of Conference: 24-28 July 2000
Date Added to IEEE Xplore: 06 August 2002
Print ISBN:1-56347-375-5
