Proceedings of 1996 Canadian Conference on Electrical and Computer Engineering

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First Page of the Article

Published in: 1996 International Conference on Simulation of Semiconductor Processes and Devices. SISPAD '96 (IEEE Cat. No.96TH8095)

Date of Conference: 02-04 September 1996

Date Added to IEEE Xplore: 06 August 2002

Print ISBN:0-7803-2745-4

DOI: 10.1109/SISPAD.1996.865287

Conference Location: Tokyo, Japan

First Page of the Article

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