I. Introduction
Partial discharge exposure in gaseous voids within solid dielectrics leads to changes in surface conditions, such as roughness or morphology, as well as in physical properties, such as charge accumulation and transport, surface and bulk conductivity [1–4, 9, 11, 16]. For example surface conductivity influences the decay of deposited charges and hence the long term inception conditions in a void [5, 10, 13, 15]. A new method is presented, for determining the effective discharge area and mapping discharge channels in the void during subsequent aging periods.