1. Introduction
In modern mobile electronic device design, high speed digital circuits can often cause radio frequency interference to the RF modules, degrading their performance. With the increasing speed of digital circuits, the electromagnetic interference between them becomes more and more critical. Meanwhile, as the device sizes are preferred to be smaller, the internal structures inside these devices are more and more complex. Many digital electronic parts can serve as potential noise sources for RF receivers. In addition, multiple noise sources can radiate simultaneously, such as the USB port and the internal SSD [1]. This will further increase the complexity to identify the coupling mechanisms and the real trouble makers. To consider the RFI issues during a particular circuit design, it is important to quantify the contribution of each part and evaluate the total coupled noise voltage prior to the final circuit layout.