Abstract:
In this paper self-calibration measuring methods are introduced to improve the accuracy of impedance measuring systems composed of standard instruments. Reference resisto...Show MoreMetadata
Abstract:
In this paper self-calibration measuring methods are introduced to improve the accuracy of impedance measuring systems composed of standard instruments. Reference resistors are used for the self-calibration of measuring systems. The random errors are reduced by data processing using averaging and smoothing. The systematic errors are self-corrected by special self-calibration algorithms. These methods are applied to the impedance measurements of electrical elements and systems and the characterization of dielectric materials under high field intensities. Analysis and measurement results show an accuracy improvement compared with the measuring systems without self-calibration. Using the self-calibration methods precise impedance measurements are realizable in the measuring systems of lower accuracy and lower product cost.
Published in: IMTC/99. Proceedings of the 16th IEEE Instrumentation and Measurement Technology Conference (Cat. No.99CH36309)
Date of Conference: 24-26 May 1999
Date Added to IEEE Xplore: 06 August 2002
Print ISBN:0-7803-5276-9
Print ISSN: 1091-5281
Keywords assist with retrieval of results and provide a means to discovering other relevant content. Learn more.
- IEEE Keywords
- Index Terms
- Measurement System ,
- Specific Algorithm ,
- Impedance Measurements ,
- Self-calibration Algorithm ,
- Data Processing ,
- Smoothing ,
- Systematic Errors ,
- Random Error ,
- High Field Intensity ,
- Interpolation ,
- Accurate Measurement ,
- Signal Processing ,
- Transfer Function ,
- Measurement Uncertainty ,
- Measure Of The Amount ,
- Oscilloscope ,
- Aperiodic ,
- Calculation Of Coefficient ,
- Discrete Fourier Transform ,
- System Noise ,
- Average Algorithm ,
- Reference Amount ,
- Sinusoidal Signal ,
- Offset Error ,
- Calibration Factor ,
- Data Synchronization
Keywords assist with retrieval of results and provide a means to discovering other relevant content. Learn more.
- IEEE Keywords
- Index Terms
- Measurement System ,
- Specific Algorithm ,
- Impedance Measurements ,
- Self-calibration Algorithm ,
- Data Processing ,
- Smoothing ,
- Systematic Errors ,
- Random Error ,
- High Field Intensity ,
- Interpolation ,
- Accurate Measurement ,
- Signal Processing ,
- Transfer Function ,
- Measurement Uncertainty ,
- Measure Of The Amount ,
- Oscilloscope ,
- Aperiodic ,
- Calculation Of Coefficient ,
- Discrete Fourier Transform ,
- System Noise ,
- Average Algorithm ,
- Reference Amount ,
- Sinusoidal Signal ,
- Offset Error ,
- Calibration Factor ,
- Data Synchronization