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A novel de-embedding method suitable for transmission-line measurement | IEEE Conference Publication | IEEE Xplore

A novel de-embedding method suitable for transmission-line measurement


Abstract:

A novel de-embedding method on transmission line device under testing (DUT) is introduced in this paper. The technique can be used as an alternative to classic calibratio...Show More

Abstract:

A novel de-embedding method on transmission line device under testing (DUT) is introduced in this paper. The technique can be used as an alternative to classic calibration approaches, such as SOLT, TRL, LRM, or LRRM whenever the de-embedded structure is a transmission line. The method only requires two measurement patterns: a true through as test fixture and a total pattern with targeting DUT embedded in. With a quasi-symmetry requirement in test fixtures, it is also a good substitute for newly released two-pattern de-embedding methodologies which have rigid symmetric demanding in text fixtures design and manufactures.
Date of Conference: 26-29 May 2015
Date Added to IEEE Xplore: 06 August 2015
ISBN Information:
Print ISSN: 2162-7673
Conference Location: Taipei, Taiwan

I. Introduction

High frequency measurement of transmission line structures is critical to characterization and development of signal integrity analysis in high speed digital circuits. Due to measurement features, transmission lines are customarily embedded into test fixtures to allow pre-requisite interfaces for measurements. However, the discontinuities introduced by test fixture (e.g. connectors, vias) are usually an unavoidable challenging for designers [1] [2]. Therefore, de-embedding is an indispensable procedure for obtaining the scattering parameters (S-parameters) of a device under test (DUT) transmission line. Although classic calibrations could be performed (SOLT, TRL, LRM, LRRM) for removing undesired test fixtures, these often require a number of precisely designed and manufactured patterns, which consume precious design space as well as measurement time. Numerous calibration patterns also require that each interconnect between measurement instruments and DUTs maintain consistency, which is a challenge—particularly in modern micro-probing application where different landing locations may introduce discrepancies into de-embedded results. For reducing the amount of calibration patterns, modeling equivalent lumped circuit [3]–[5] or equivalent networks, such as open-short [6], [7] and NL-L [8] of test fixtures are a mainstream on-going research topic for transmission line de-embedding. Typically, most of them are either assuming that test fixtures are electrically small or putting unrealistic physical design constraints.

References

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