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On the implementation of the LZZ calibration technique in the S-parameters measurement of devices mounted in test fixtures | IEEE Conference Publication | IEEE Xplore

On the implementation of the LZZ calibration technique in the S-parameters measurement of devices mounted in test fixtures


Abstract:

This paper introduces a methodology for the design and verification of the set of microstrip structures necessary to implement the line, offset-open, offset-short (LZZ) c...Show More

Abstract:

This paper introduces a methodology for the design and verification of the set of microstrip structures necessary to implement the line, offset-open, offset-short (LZZ) calibration technique in the small-signal characterization of devices mounted in coaxial-to-microstrip test fixtures. The usefulness of the LZZ calibration in such application is verified by comparing the S-parameters of a GaN-HEMT packaged transistor corrected using the LZZ with those corrected using the thru-reflect-line (TRL) calibration technique.
Date of Conference: 22-22 May 2015
Date Added to IEEE Xplore: 20 July 2015
Electronic ISBN:978-1-4799-8887-7
Conference Location: Phoenix, AZ, USA

I. Introduction

At microwave frequencies, the use of a calibrated vector network analyzer (VNA) is mandatory to characterize the linear behavior of a device under test (DUT). A number of VNA calibration techniques have been proposed in the literature. Among them, the most commonly used calibration techniques are the thru-reflect-line (TRL) [1], thru-reflect-match (TRM) [2] and thru-reflect-reflect-match (TRRM) [3].

References

References is not available for this document.