I. Introduction
With the high speed and low voltage operation of integrated circuits, the electromagnetic (EM) immunity of electronic devices against EM disturbances has been degrading. On the other hand, electrostatic discharge (ESD) events from charged humans produce transient EM fields with broadband frequency spectra. Therefore ESD events from charged human are known to cause a more serious failure in high-tech information equipment [1]–[5], while its mechanism remains unknown.