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Diagnostics of the soft X-ray emission in a plasma focus device | IEEE Conference Publication | IEEE Xplore

Diagnostics of the soft X-ray emission in a plasma focus device


Abstract:

Experimental results of the soft X-ray spectra investigation from a hot plasma produced by impulse discharge of a dense plasma focus in pure neon are presented. The spect...Show More

Abstract:

Experimental results of the soft X-ray spectra investigation from a hot plasma produced by impulse discharge of a dense plasma focus in pure neon are presented. The spectral-energy characteristics of X-ray emission were measured in the photon energy range of 0.5-5.0 keV with the help of thin absorber filters set and silicon semiconductor p-i-n detectors SPPD11-04. A study was made at the filling gas pressure P/sub Ne/=2.0-6.0 Torr and at the stored capacitor bank energy W=15-21 kJ. A high degree of monochromatization for the soft X-ray emission (/spl sim/90 %) was obtained. According to the experimental data characteristic plasma electron temperature in the time duration of X-ray pulse /spl tau//sub 1/2/=10-100 ns has been estimated as T/sub e//spl sim/0.2-0.3 keV. The plasma parameters obtained are compared with the results of computer simulation of the emission process.
Date of Conference: 29 June 1997 - 02 July 1997
Date Added to IEEE Xplore: 06 August 2002
Print ISBN:0-7803-4213-5
Conference Location: Baltimore, MD, USA

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