Style Features for Authors in Two Languages | IEEE Conference Publication | IEEE Xplore

Style Features for Authors in Two Languages


Abstract:

Stylometry is the measurement of certain expressible features of writing style, and its uses include the characterization of authors for recognition in cases of text whos...Show More

Abstract:

Stylometry is the measurement of certain expressible features of writing style, and its uses include the characterization of authors for recognition in cases of text whose authorship is disputed or unknown. This work builds upon previous investigation into the success of a particular feature set on a particular corpus. We explore the creation and testing of a small corpus spanning multiple languages and character sets, and the building of a feature set for use in author attribution problems over that corpus. In-depth analysis of results is used to motivate further work.
Date of Conference: 17-20 November 2013
Date Added to IEEE Xplore: 23 December 2013
ISBN Information:
Conference Location: Atlanta, GA, USA

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