I. Introduction
High-frequency harmonics generated from the digital ICs and switched power supplies may couple into the antennas which are integrated into mobile systems such as cell phones. The noise of the harmonics is added to the natural noise floor of the receiver and overwhelms weak signals which should be received by the receiver [1], [2]. Near-field probes [3], [4] and scanning technique are effective tools to investigate noise field distribution of circuits at high frequency and to locate the source of the EMI problems at circuit and chip level [5], [6].