I. Introduction and background
The development of future THz communication systems will require the exact knowledge of the radio channel properties [1]. While the feasibility of signal transmission in the lower THz frequency range has been demonstrated successfully [2]–[4], few work has been done on actually measuring channel transfer functions [5]. However, the reliable prediction of coverage and system performance based on ray tracing simulations [1] requires the accurate knowledge of reflection properties of materials present in the considered scenario [6] as well as the proper modeling of scattering and diffraction effects. A very recent study including angular resolved and 1D translatory diffraction measurements in comparison to calculations based on the uniform geometrical theory of diffraction (UTD) and the knife edge diffraction (KED) showed the importance of diffraction for propagation modeling in the THz frequency range [7]. These measurements are now extended to 2D studies including considerations of occurring measurement uncertainties [8], [9].