Measurement of the spatial resolution of wide-pitch silicon strip detectors with large incident angle

As a part of R&D for the BELLE experiment at KEK-B, we measured the spatial resolution of silicon strip detectors for particles with incident angles ranging from 0/spl deg/ to 75/spl deg/. These detectors have strips with pitches of 50, 125 and 250 /spl mu/m on the ohmic side. We have obtained the incident angle dependence which agreed well with a Monte Carlo simulation. The resolution was found to be 11 /spl mu/m for normal incidence with a pitch of 50 /spl mu/m, and 29 /spl mu/m for incident angle of 75/spl deg/ with a pitch of 250 /spl mu/m.